G01R 31/318307
Computer-aided
Official title: {computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging}
G01R31/318307 (Computer-aided) appears on 328 US grants and 217 published applications in this corpus.
Search patents in G01R- Granted patents
- 328
- Published applications
- 217
- Assignees
- 169
- Inventors
- 767
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 5 | 0 |
| 1991 | 3 | 0 |
| 1992 | 4 | 0 |
| 1993 | 3 | 0 |
| 1994 | 8 | 0 |
| 1995 | 10 | 0 |
| 1996 | 6 | 0 |
| 1997 | 8 | 0 |
| 1998 | 16 | 0 |
| 1999 | 15 | 0 |
| 2000 | 10 | 0 |
| 2001 | 14 | 4 |
| 2002 | 16 | 9 |
| 2003 | 8 | 18 |
| 2004 | 16 | 20 |
| 2005 | 11 | 13 |
| 2006 | 16 | 11 |
| 2007 | 14 | 6 |
| 2008 | 8 | 8 |
| 2009 | 13 | 8 |
| 2010 | 5 | 9 |
| 2011 | 11 | 1 |
| 2012 | 6 | 4 |
| 2013 | 4 | 5 |
| 2014 | 2 | 6 |
| 2015 | 6 | 4 |
| 2016 | 3 | 5 |
| 2017 | 4 | 4 |
| 2018 | 4 | 6 |
| 2019 | 11 | 10 |
| 2020 | 12 | 13 |
| 2021 | 9 | 10 |
| 2022 | 11 | 12 |
| 2023 | 6 | 10 |
| 2024 | 11 | 9 |
| 2025 | 7 | 4 |
| 2026 | 7 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Seamless universal verification methodology1 Sep 2026US 12,724,070 B1Amazon Technologies, Inc.
- Method and system of developing and executing test program for verifying DUT18 Aug 2026US 12,710,468 B2Microtest S.p.A.
- Automated test equipment and method using a trigger generation11 Aug 2026US 12,704,547 B2Advantest Corporation
- Path margin monitoring28 Jul 2026US 12,694,179 B1Synopsys, Inc.
- Integrated-circuit chip for retention cell testing23 Jun 2026US 12,663,469 B2Nordic Semiconductor ASA
- Jtag-based soc design verification on emulation1 Oct 2026US 2026/0299020 A1Microsoft Technology Licensing, LLC
- Methods, systems, and computer readable media for providing a test system with emulation modeling1 Oct 2026US 2026/0299022 A1Keysight Technologies, Inc.
- Test apparatus and method for operating a test apparatus17 Sep 2026US 2026/0276706 A1Advantest Corporation
- Method and device for predicting wafer test data18 Jun 2026US 2026/0169067 A1DigWise Technology Corporation, LTD
- Hardware decoder for run-length encoded mask bits for in-system automatic test pattern generation (atpg)28 May 2026US 2026/0147040 A1QUALCOMM Incorporated
Most cited
By later US patents
- Method of generating instruction sequences for controlling data flow processes231US 5,136,705 ATektronix, Inc. · 1992
- Graphical data base editor166US 5,371,851 ACredence Systems Corporation · 1994
- Method and apparatus for test generation during circuit design143US 6,182,258 B2Verisity Ltd. · 2001
- Dynamic process for the generation of biased pseudo-random test patterns for the functional verification of hardware designs119US 5,202,889 AInternational Business Machines Corporation · 1993
- Control system for automated parametric test equipment100US 5,206,582 AHewlett-Packard Company · 1993