Test apparatus and method for operating a test apparatus

A computer-implemented method for processing test data for a device under test (DUT), the computer-implemented method comprising:

• generating a test data set (TDS) for a test, the TDS comprising a plurality of test values (TVs) and at least one test result (TR), each TV of the plurality of TVs corresponds to a test parameter of the test, the at least one TR corresponds to a performance parameter of the DUT detected during the test;
• generating a reduced test data set (RTDS) comprising the at least one TR and a first strict subset of the plurality of TVs, TVs of the first strict subset being more influential for generating the at least one TR during the test than TVs not part of the first strict subset, the TVs of the first strict subset being selected according to a first variable selection algorithm;
• generating one or more function values (FVs) for the RTDS, each of the one or more FVs being based on at least two of the TVs in the RTDS;
• and
• generating a reduced supplemented data set (RSDS) comprising the at least one TR and a second strict subset of the TVs and the one or more FVs, values of the second strict subset being more influential for generating the at least one TR during the test than the values not part of the second strict subset, the values of the second strict subset being selected according to a second variable selection algorithm.

One or more non-transitory machine-readable storage media comprising program code which, when executed by one or more processors, is configured to cause the one or more processors to perform the steps of:

• generating a test data set (TDS) for a test, the TDS comprising a plurality of test values (TVs) and at least one test result (TR), each TV of the plurality of TVs corresponds to a test parameter of the test, the at least one TR corresponds to a performance parameter of the DUT detected during the test;
• generating a reduced test data set (RTDS) comprising the at least one TR and a first strict subset of the plurality of TVs, TVs of the first strict subset being more influential for generating the at least one TR during the test than TVs not part of the first strict subset, the TVs of the first strict subset being selected according to a first variable selection algorithm;
• generating one or more function values (FVs) for the RTDS, each of the one or more FVs being based on at least two of the TVs in the RTDS;
• and
• generating a reduced supplemented data set (RSDS) comprising the at least one TR and a second strict subset of the TVs and the one or more FVs, values of the second strict subset being more influential for generating the at least one TR during the test than the values not part of the second strict subset, the values of the second strict subset being selected according to a second variable selection algorithm.

A test apparatus comprising:

• one or more processors;
• and
• one or more storage media storing program code'
• wherein when the program code is executed by the one or more processors, the one or more processors perform the steps of:
• generating a test data set (TDS) for a test, the TDS comprising a plurality of test values (TVs) and at least one test result (TR), each TV of the plurality of TVs corresponds to a test parameter of the test, the at least one TR corresponds to a performance parameter of the DUT detected during the test;
• generating a reduced test data set (RTDS) comprising the at least one TR and a first strict subset of the plurality of TVs, TVs of the first strict subset being more influential for generating the at least one TR during the test than TVs not part of the first strict subset, the TVs of the first strict subset being selected according to a first variable selection algorithm;
• generating one or more function values (FVs) for the RTDS, each of the one or more FVs being based on at least two of the TVs in the RTDS;
• and
• generating a reduced supplemented data set (RSDS) comprising the at least one TR and a second strict subset of the TVs and the one or more FVs, values of the second strict subset being more influential for generating the at least one TR during the test than the values not part of the second strict subset, the values of the second strict subset being selected according to a second variable selection algorithm.