G01R 31/31713
Input or output interfaces for test
Official title: {Input or output interfaces for test, e.g. test pins, buffers (for scan test G01R31/318572)}
G01R31/31713 (Input or output interfaces for test) appears on 393 US grants and 383 published applications in this corpus.
Search patents in G01R- Granted patents
- 393
- Published applications
- 383
- Assignees
- 151
- Inventors
- 585
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 10 | 0 |
| 1988 | 1 | 0 |
| 1989 | 2 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 1 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 7 | 2 |
| 2003 | 3 | 5 |
| 2004 | 4 | 7 |
| 2005 | 4 | 8 |
| 2006 | 6 | 10 |
| 2007 | 15 | 14 |
| 2008 | 6 | 13 |
| 2009 | 15 | 14 |
| 2010 | 13 | 17 |
| 2011 | 23 | 18 |
| 2012 | 13 | 13 |
| 2013 | 10 | 16 |
| 2014 | 20 | 13 |
| 2015 | 13 | 21 |
| 2016 | 22 | 20 |
| 2017 | 18 | 18 |
| 2018 | 13 | 13 |
| 2019 | 12 | 17 |
| 2020 | 17 | 14 |
| 2021 | 17 | 26 |
| 2022 | 24 | 29 |
| 2023 | 24 | 29 |
| 2024 | 31 | 18 |
| 2025 | 20 | 15 |
| 2026 | 10 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Chip testing method and apparatus15 Sep 2026US 12,736,583 B2Xiamen Industrial Technology Research Institute Co., Ltd.
- Testing circuit for testing electrical devices and device under test8 Sep 2026US 12,730,147 B2Winbond Electronics Corp.
- Semiconductor test apparatus and power supply method thereof1 Sep 2026US 12,724,067 B2Samsung Electronics Co., Ltd.
- Method, device, and system for detecting fuse configuration for trimming circuit21 Jul 2026US 12,687,577 B2Samsung Electronics Co., Ltd.
- System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test14 Jul 2026US 12,681,084 B1Marvell Asia Pte Ltd
- Portable device and method for performing multiple tests on an electronic circuit20 Aug 2026US 2026/0243825 A1
- Modular data center installation, testing, measurement, and maintenance device6 Aug 2026US 2026/0227440 A1Viavi Solutions Inc.
- Methodology of using chip-to-chip bypass path for multi-die structural test30 Jul 2026US 2026/0219316 A1NVIDIA Corporation
- Scannable multibit self-gating flip-flop system2 Jul 2026US 2026/0186053 A1Advanced Micro Devices, Inc.
- Fast wafer test for event-based vision sensor21 May 2026US 2026/0140172 A1OmniVision Technologies, Inc.
Most cited
By later US patents
- Full wafer integrated circuit testing device306US 5,070,297 ATexas Instruments Incorporated · 1991
- Method and apparatus for evaluating and optimizing a signaling system146US 7,490,275 B2Rambus Inc. · 2009
- Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits134US 6,542,844 B1International Business Machines Corporation · 2003
- Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits131US 4,646,299 AFairchild Semiconductor Corporation · 1987
- Method and apparatus for monitoring automated testing of electronic circuits103US 4,637,020 AFairchild Semiconductor Corporation · 1987