G01R 31/2882
Testing timing characteristics
Official title: {Testing timing characteristics}
G01R31/2882 (Testing timing characteristics) appears on 231 US grants and 215 published applications in this corpus.
Search patents in G01R- Granted patents
- 231
- Published applications
- 215
- Assignees
- 133
- Inventors
- 506
- Latest grant
- 31 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 7 | 0 |
| 1999 | 3 | 0 |
| 2000 | 4 | 0 |
| 2001 | 5 | 0 |
| 2002 | 8 | 5 |
| 2003 | 7 | 8 |
| 2004 | 7 | 6 |
| 2005 | 4 | 10 |
| 2006 | 7 | 11 |
| 2007 | 9 | 7 |
| 2008 | 5 | 1 |
| 2009 | 6 | 5 |
| 2010 | 5 | 5 |
| 2011 | 5 | 1 |
| 2012 | 1 | 8 |
| 2013 | 2 | 6 |
| 2014 | 6 | 5 |
| 2015 | 9 | 9 |
| 2016 | 8 | 12 |
| 2017 | 15 | 13 |
| 2018 | 10 | 12 |
| 2019 | 15 | 17 |
| 2020 | 12 | 12 |
| 2021 | 17 | 11 |
| 2022 | 6 | 9 |
| 2023 | 16 | 11 |
| 2024 | 7 | 9 |
| 2025 | 15 | 13 |
| 2026 | 1 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Monitoring circuit, semiconductor integrated circuit device, and vehicle31 Mar 2026US 12,591,004 B2Rohm Co., Ltd.
- Method of measuring chip characteristics, test device and non-transitory computer readable media30 Dec 2025US 12,510,589 B2Global Unichip Corporation
- Electric power measurement circuit2 Dec 2025US 12,487,276 B2Panasonic Automotive Systems Co., Ltd.
- Programmable delay testing circuit25 Nov 2025US 12,480,989 B2STMicroelectronics International N. V.
- Integrated circuit margin measurement4 Nov 2025US 12,461,143 B2Proteantecs Ltd.
- Test circuitry for ring amplifier17 Sep 2026US 2026/0276700 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method for testing a packaging substrate, and apparatus for testing a packaging substrate17 Sep 2026US 2026/0276702 A1
- Process variation detection and adaptive voltage scaling13 Aug 2026US 2026/0238193 A1Xilinx, Inc.
- Adapting design constraints for static timing analysis of a circuit30 Jul 2026US 2026/0220350 A1International Business Machines Corporation
- Monitoring circuit, semiconductor integrated circuit device, and vehicle25 Jun 2026US 2026/0177608 A1Rohm Co., Ltd.
Most cited
By later US patents
- Semiconductor process and performance sensor185US 10,614,184 B2Atlazo, Inc. · 2020
- Method and apparatus for testing semiconductor devices at speed76US 5,524,114 ALSI Logic Corporation · 1996
- Method for characterizing interconnect timing characteristics using reference ring oscillator circuit62US 5,790,479 AXilinx, Inc. · 1998
- In-situ monitor of process and device parameters in integrated circuits61US 7,594,149 B2Integrated Device Technology, Inc. · 2009
- Single pin performance screen ring oscillator with frequency division60US 6,426,641 B1International Business Machines Corporation · 2002