Test circuitry for ring amplifier
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsPO-YU LAI, MEI-CHEN CHUANG
Life of this patent
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Abstract
A measuring circuit is provided, which includes a clock generator, a test circuit, and a trigger circuit. The clock generator is configured to convert an input clock signal into a plurality of clock signals, which are non-overlapping, and generate a counter signal. The test circuit is coupled to an output terminal of a ring amplifier and is configured to store electric charges from a load capacitance of the ring amplifier using a test capacitance. The trigger circuit is configured to generate a trigger signal for measuring an output voltage of the ring amplifier based on the counter signal.
Claims20
A measuring circuit, comprising:
- a clock generator, configured to convert an input clock signal into a plurality of clock signals, which are non-overlapping, and generate a counter signal;
- a test circuit, coupled to an output terminal of a ring amplifier, and configured to store electric charges from a load capacitance of the ring amplifier using a test capacitance;
- and
- a trigger circuit, configured to generate a trigger signal for measuring an output voltage of the ring amplifier based on the counter signal.
A measuring circuit, comprising:
- a clock generator, configured to convert an input clock signal into a plurality of clock signals and generate a counter signal;
- a test circuit, coupled to an output terminal of a ring amplifier, and configured to accumulate a voltage potential across a test capacitance, coupled to a load capacitance of the ring amplifier through a first switch, at a plurality of periods within a sharing phase of the ring amplifier;
- and
- a trigger circuit, configured to generate a trigger signal for measuring an output voltage of the ring amplifier based on the counter signal.
A method, comprising:
- charging a load capacitance coupled to an output terminal of a ring amplifier during an amplification phase of the ring amplifier;
- accumulating, using a test capacitance, part of electric charges from the load capacitance at a plurality of periods within a sharing phase of the ring amplifier;
- and
- measuring a voltage potential across the test capacitance as an output voltage of the ring amplifier in response to a trigger signal generated from an input clock signal.
Dependencies are inferred from the claim text.