G01R 31/281
Specific types of tests or tests for a specific type of fault
Official title: {Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing (G01R31/2818 takes precedence)}
G01R31/281 (Specific types of tests or tests for a specific type of fault) appears on 807 US grants and 732 published applications in this corpus.
Search patents in G01R- Granted patents
- 807
- Published applications
- 732
- Assignees
- 484
- Inventors
- 1,904
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 3 | 0 |
| 1986 | 0 | 0 |
| 1987 | 4 | 0 |
| 1988 | 6 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 4 | 0 |
| 1992 | 10 | 0 |
| 1993 | 5 | 0 |
| 1994 | 6 | 0 |
| 1995 | 14 | 0 |
| 1996 | 16 | 0 |
| 1997 | 16 | 0 |
| 1998 | 18 | 0 |
| 1999 | 15 | 0 |
| 2000 | 10 | 0 |
| 2001 | 12 | 4 |
| 2002 | 12 | 16 |
| 2003 | 16 | 15 |
| 2004 | 25 | 17 |
| 2005 | 15 | 23 |
| 2006 | 20 | 32 |
| 2007 | 21 | 19 |
| 2008 | 17 | 30 |
| 2009 | 18 | 18 |
| 2010 | 22 | 15 |
| 2011 | 22 | 23 |
| 2012 | 13 | 30 |
| 2013 | 19 | 19 |
| 2014 | 24 | 28 |
| 2015 | 20 | 37 |
| 2016 | 27 | 22 |
| 2017 | 27 | 28 |
| 2018 | 28 | 43 |
| 2019 | 44 | 49 |
| 2020 | 42 | 49 |
| 2021 | 42 | 51 |
| 2022 | 54 | 41 |
| 2023 | 42 | 46 |
| 2024 | 43 | 20 |
| 2025 | 27 | 37 |
| 2026 | 13 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Testing a circuit board6 Oct 2026US 12,754,230 B2Teradyne, Inc.
- Electronic device including dew condensation sensor18 Aug 2026US 12,710,389 B2LG Electronics Inc.
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- Method and apparatus for monitoring the condition of a power semiconductor module7 Jul 2026US 12,674,833 B2ABB Schweiz AG
- Test and repair of interconnects between chips9 Jun 2026US 12,650,459 B2Intel Corporation
- Test board for characterizing dendrite growth in immersion-cooling systems1 Oct 2026US 2026/0299008 A1MTS IP Holdings Ltd
- Method for estimating the level of damage to an element of an assembly, and predictive maintenance method implemented on the basis of such an estimation method24 Sep 2026US 2026/0287641 A1Safran Electronics & Defense
- Memory devices and memory systems outputting codes24 Sep 2026US 2026/0287654 A1SK hynix Inc.
- Form factor equivalent load testing device2 Jul 2026US 2026/0186047 A1Progranalog Corp.
- Arrangement with a printed circuit board and a circuit for detecting carbonization of the printed circuit board25 Jun 2026US 2026/0181782 A1Hella GmbH & Co. KGaA
Most cited
By later US patents
- Addressable shadow port and protocol for serial bus networks133US 5,483,518 ATexas Instruments Incorporated · 1996
- Apparatus for use in testing circuit boards107US 4,683,424 AWehr Corporation · 1987
- Boundary scan architecture analog extension with direct connections103US 5,887,001 ABull HN Information Systems Inc. · 1999
- Non-destructive flex testing method and means93US 5,424,634 AInternational Business Machines Corporation · 1995
- Run-in test system for PC circuit board91US 5,543,727 ABellSouth Corporation · 1996