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AssigneeABB Schweiz AG
InventorsOlli Alkkiomäki, Panagiotis Kakosimos, Kari Tikkanen, Teppo Pirttioja, Aleksi Vulli
Estimating the term…
A field of electric drive devices and arrangements including a plurality of power semiconductor components formed in or on a common substrate, and more particularly to a method and an apparatus for monitoring the condition of a power semiconductor module. The method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine includes the steps of engaging a locking of the rotor of the electric machine at zero speed or at near zero speed by injecting DC currents by the electric drive device, initiating test temperature recording in the power semiconductor module, disengaging the locking the rotor of the electric machine by the electric drive device, terminating the test temperature recording and storing the recorded data of the test temperature as test temperature data, and determining the condition of the power semiconductor module utilising the test temperature data.
A method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine, which method comprises the steps of:
An apparatus for monitoring the condition of a power semiconductor module of an electric drive device in an arrangement including an electric drive device connected to an electric machine, the apparatus comprising:
Dependencies are inferred from the claim text.