Run-in test system for PC circuit board
AssigneeBellSouth Corporation
InventorsBradley B. Bushard, Philip G. Dion, Joseph V. Heinz
Life of this patent
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AssigneeBellSouth Corporation
InventorsBradley B. Bushard, Philip G. Dion, Joseph V. Heinz
Estimating the term…
An automated functional test system for PC circuit boards. The test system includes a test chamber for removably receiving circuit boards to be tested, heating and cooling systems for controlling the temperature in the test chamber, a display, a variable circuit board power supply and diagnostics memory for storing PC circuit board diagnostic software. A control system is coupled to the heating and cooling systems, display, power supply and diagnostics memory. The control system causes the circuit board to execute the diagnostic software during low temperature, high temperature and cycling temperature diagnostic phases. The diagnostic phases are sequentially and repeatedly performed during a test cycle. The cooling system is actuated during the low temperature diagnostic phases to cool the test chamber to ambient temperature. The heating system is actuated during the high temperature diagnostic phases to heat the test chamber. Both the heating and cooling systems are actuated during the cycling temperature diagnostic phases to cycle the temperature. The power supplied to the circuit board is varied during the diagnostic phases. If the circuit board fails to properly execute the diagnostic software during the diagnostic phases, the display is actuated to provide an indication of a functional test failure. The display is actuated to provide an indication of a functional test completion at the end of the test cycle if the circuit board successfully executes the diagnostic software during the diagnostic phases.
A run-in test system for microprocessor-based circuit boards, including:
A run-in test system for microprocessor-based circuit boards, including:
A computer-readable storage medium programmed with communication/diagnostic branch control software for execution by a microprocessor-based circuit board unit under test (UUT), and adapted for use in connection with a run-in test system of the type including a temperature control system, a display, memory for storing UUT-executable self-diagnostic software and diagnostic software monitoring means for monitoring the UUT execution of the self-diagnostic software and causing the display to provide an indication of a run-in test failure if the UUT fails to properly execute the self-diagnostic software, wherein the communication/diagnostic branch control software includes:
A computer-readable storage medium programmed with communication/diagnostic branch control software for execution by a microprocessor-based circuit board unit under test (UUT), and adapted for use in connection with a microprocessor-based circuit board run-in test system of the type including a temperature control system, a display, memory for storing UUT-executable self-diagnostic software, watchdog timer means for timing watchdog periods and for causing the display to provide an indication of a run-in test failure if the UUT fails to properly execute the self-diagnostic software during the watchdog periods, and test cycle timing means for timing a test cycle and for causing the display to provide an indication of a successful run-in test if the UUT successfully executes the self-diagnostic software during the test cycle, wherein the communication/diagnostic branch control software includes:
Dependencies are inferred from the claim text.