G01R 31/2817
Environmental-, stress-, or burn-in tests
Official title: {Environmental-, stress-, or burn-in tests (of IC's G01R31/2855; of individual semiconductors G01R31/2642; of other circuits G01R31/2849)}
G01R31/2817 (Environmental-, stress-, or burn-in tests) appears on 200 US grants and 175 published applications in this corpus.
Search patents in G01R- Granted patents
- 200
- Published applications
- 175
- Assignees
- 148
- Inventors
- 510
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 7 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 7 | 0 |
| 1999 | 5 | 0 |
| 2000 | 3 | 0 |
| 2001 | 2 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 3 | 3 |
| 2005 | 3 | 1 |
| 2006 | 3 | 5 |
| 2007 | 6 | 7 |
| 2008 | 5 | 9 |
| 2009 | 6 | 2 |
| 2010 | 4 | 3 |
| 2011 | 4 | 1 |
| 2012 | 1 | 8 |
| 2013 | 1 | 6 |
| 2014 | 6 | 9 |
| 2015 | 4 | 5 |
| 2016 | 7 | 4 |
| 2017 | 6 | 10 |
| 2018 | 8 | 13 |
| 2019 | 16 | 10 |
| 2020 | 8 | 13 |
| 2021 | 11 | 18 |
| 2022 | 14 | 12 |
| 2023 | 15 | 13 |
| 2024 | 11 | 4 |
| 2025 | 6 | 13 |
| 2026 | 6 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electronic device including dew condensation sensor18 Aug 2026US 12,710,389 B2LG Electronics Inc.
- Method and device for measuring the state of health of semiconductor-based electronic components11 Aug 2026US 12,704,540 B2Universite Gustave Eiffel
- Method for determining wear in an electronic unit, and test apparatus2 Jun 2026US 12,644,920 B2Robert Bosch GmbH
- Method of monitoring a health state of a power semiconductor device by monitoring inverter case temperature during steady state loading31 Mar 2026US 12,591,001 B2ROLLS-ROYCE plc
- Force, deflection, resistance, and temperature testing system and method of use10 Mar 2026US 12,571,833 B2Modus Test, LLC
- Test board for characterizing dendrite growth in immersion-cooling systems1 Oct 2026US 2026/0299008 A1MTS IP Holdings Ltd
- Form factor equivalent load testing device2 Jul 2026US 2026/0186047 A1Progranalog Corp.
- Method and Device for Automatically Detecting a Thermal Anomaly in Equipment11 Jun 2026US 2026/0160796 A1Thales
- Health monitoring of a switch5 Feb 2026US 2026/0036618 A1
- Semiconductor package heat generation simulation unit for checking heat distribution of burn-in board and method for acquiring heat distribution of burn-in board using the same29 Jan 2026US 2026/0029462 A1TFE Company, LLC
Most cited
By later US patents
- Apparatus for use in testing circuit boards107US 4,683,424 AWehr Corporation · 1987
- Non-destructive flex testing method and means93US 5,424,634 AInternational Business Machines Corporation · 1995
- Run-in test system for PC circuit board91US 5,543,727 ABellSouth Corporation · 1996
- Environmental hood for testing printed circuit cards77US 4,172,993 AThe Singer Company · 1979
- Electrical testing system including plastic window test chamber and method of using same69US 4,426,619 ATemptronic Corporation · 1984