Method for determining wear in an electronic unit, and test apparatus

Abstract

A method for determining wear in an electronic unit, in particular a power electronics unit, which includes at least one electronic component, in particular a semiconductor component, capacitor or the like. The unit is subjected to a test procedure in which at least two predefinable electrical load cycles are applied to the unit, in which cycles the unit is operated in each case in order to simulate at least one selected operating mode for a predefined period of time. During the test procedure, electromagnetic waves generated by the unit by an electrical load resulting from the application of the at least two load cycles to the unit are detected for at least two of the load cycles, and the detected electromagnetic waves of the at least two load cycles are compared with one another in order to detect wear in the unit.

Dependencies are inferred from the claim text.