G01B 11/0625
With measurement of absorption or reflection
Official title: {with measurement of absorption or reflection}
G01B11/0625 (With measurement of absorption or reflection) appears on 846 US grants and 927 published applications in this corpus.
Search patents in G01B- Granted patents
- 846
- Published applications
- 927
- Assignees
- 481
- Inventors
- 2,041
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 2 | 0 |
| 1984 | 1 | 0 |
| 1985 | 4 | 0 |
| 1986 | 3 | 0 |
| 1987 | 8 | 0 |
| 1988 | 6 | 0 |
| 1989 | 2 | 0 |
| 1990 | 6 | 0 |
| 1991 | 6 | 0 |
| 1992 | 2 | 0 |
| 1993 | 2 | 0 |
| 1994 | 5 | 0 |
| 1995 | 10 | 0 |
| 1996 | 10 | 0 |
| 1997 | 6 | 0 |
| 1998 | 8 | 0 |
| 1999 | 12 | 0 |
| 2000 | 9 | 0 |
| 2001 | 7 | 4 |
| 2002 | 6 | 18 |
| 2003 | 21 | 19 |
| 2004 | 29 | 31 |
| 2005 | 14 | 23 |
| 2006 | 29 | 26 |
| 2007 | 24 | 36 |
| 2008 | 30 | 29 |
| 2009 | 18 | 27 |
| 2010 | 26 | 27 |
| 2011 | 16 | 25 |
| 2012 | 25 | 26 |
| 2013 | 21 | 35 |
| 2014 | 26 | 29 |
| 2015 | 21 | 38 |
| 2016 | 33 | 32 |
| 2017 | 27 | 28 |
| 2018 | 28 | 50 |
| 2019 | 40 | 57 |
| 2020 | 43 | 55 |
| 2021 | 53 | 76 |
| 2022 | 40 | 53 |
| 2023 | 46 | 50 |
| 2024 | 48 | 57 |
| 2025 | 42 | 44 |
| 2026 | 25 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Film thickness measurement device and film thickness measurement method15 Sep 2026US 12,736,327 B2Hamamatsu Photonics K.K.
- Thickness-distribution measurement device and thickness-distribution measurement method8 Sep 2026US 12,729,951 B2Hamamatsu Photonics K.K.
- Methods and systems to measure properties of moving products in device manufacturing machines4 Aug 2026US 12,699,049 B2APPLIED Materials.Inc.
- 3D memory device, measurement method thereof, and film measurement device4 Aug 2026US 12,701,698 B2Yangtze Memory Technologies Co., Ltd.
- Coating evaluation device and coating evaluation method28 Jul 2026US 12,693,227 B2Nissan Motor Co., Ltd.
- Method of Characterizing Layer Thickness24 Sep 2026US 2026/0287328 A13M Innovative Properties Company
- Measurement processing apparatus, measurement method, and storage medium24 Sep 2026US 2026/0287329 A1Otsuka Electronics Co., Ltd.
- Patient support with deck width monitoring and control17 Sep 2026US 2026/0272744 A1Stryker Corporation
- Method of Characterizing Layer Thickness17 Sep 2026US 2026/0276367 A13M Innovative Properties Company
- Polymer monitoring device and method using terahertz waves17 Sep 2026US 2026/0276537 A1Iucf-Hyu (Industry-University Cooperation Foundation Hanyang
Most cited
By later US patents
- Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness321US 5,486,701 APrometrix Corporation · 1996
- Optical system and method for angle-dependent reflection or transmission measurement255US 5,889,593 AKLA Instruments Corporation · 1999
- Methods and apparatus for detecting removal of thin film layers during planarization210US 5,872,633 ASpeedfam Corporation · 1999
- Apparatus and method for real-time measurement of thin film layer thickness and changes thereof206US 5,450,205 AMassachusetts Institute of Technology · 1995
- Multiple tool and structure analysis196US 7,478,019 B2KLA-Tencor Corporation · 2009