G01B 11/06
For measuring thickness
Official title: for measuring thickness {; e.g. of sheet material (thickness measurement by thermal means G01B21/085)}
G01B11/06 (For measuring thickness) appears on 3,688 US grants and 3,679 published applications in this corpus.
Search patents in G01B- Granted patents
- 3,688
- Published applications
- 3,679
- Assignees
- 1,641
- Inventors
- 7,834
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 11 | 0 |
| 1977 | 12 | 0 |
| 1978 | 13 | 0 |
| 1979 | 11 | 0 |
| 1980 | 14 | 0 |
| 1981 | 17 | 0 |
| 1982 | 11 | 0 |
| 1983 | 9 | 0 |
| 1984 | 11 | 0 |
| 1985 | 19 | 0 |
| 1986 | 14 | 0 |
| 1987 | 24 | 0 |
| 1988 | 18 | 0 |
| 1989 | 25 | 0 |
| 1990 | 33 | 0 |
| 1991 | 23 | 0 |
| 1992 | 22 | 0 |
| 1993 | 25 | 0 |
| 1994 | 38 | 0 |
| 1995 | 43 | 0 |
| 1996 | 36 | 0 |
| 1997 | 42 | 0 |
| 1998 | 53 | 0 |
| 1999 | 63 | 0 |
| 2000 | 59 | 0 |
| 2001 | 55 | 18 |
| 2002 | 53 | 74 |
| 2003 | 87 | 77 |
| 2004 | 91 | 105 |
| 2005 | 69 | 100 |
| 2006 | 98 | 103 |
| 2007 | 102 | 115 |
| 2008 | 101 | 91 |
| 2009 | 88 | 100 |
| 2010 | 89 | 117 |
| 2011 | 62 | 103 |
| 2012 | 81 | 108 |
| 2013 | 78 | 111 |
| 2014 | 99 | 130 |
| 2015 | 110 | 142 |
| 2016 | 115 | 142 |
| 2017 | 125 | 152 |
| 2018 | 137 | 219 |
| 2019 | 208 | 193 |
| 2020 | 180 | 219 |
| 2021 | 175 | 253 |
| 2022 | 202 | 242 |
| 2023 | 160 | 210 |
| 2024 | 185 | 199 |
| 2025 | 179 | 186 |
| 2026 | 113 | 170 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Predictive biomass map generation and control6 Oct 2026US 12,751,362 B2Deere & Company
- Method and system for determining key dimension of low-dimensional materials by optical scattering6 Oct 2026US 12,754,126 B2Shandong University
- Epoxy molding compound thickness measurement method and measurement device29 Sep 2026US 12,747,942 B2Actro Co., Ltd.
- Layer thickness determination by four-wave-mixing spectroscopy22 Sep 2026US 12,742,635 B2Monstr Sense Technologies, LLC
- Height measurement sensor using derivative of periodic points22 Sep 2026US 12,742,636 B2ASML Netherlands B. V.
- System for measuring optical pulse time-of-flight8 Oct 2026US 2026/0309480 A1Korea Advanced Institute of Science and Technology
- Device for measuring the flatness of a surface or the thickness of a flat glass panel8 Oct 2026US 2026/0309481 A1
- Hot end glass container thickness evaluation8 Oct 2026US 2026/0309482 A1Owens-Brockway Glass Container Inc.
- Optical thin film analysis apparatus not affected by substrate back surface reflection and analysis method thereof8 Oct 2026US 2026/0309623 A1
- Polishing method, polishing monitoring method and polishing monitoring apparatus for workpiece1 Oct 2026US 2026/0295767 A1Ebara Corporation
Most cited
By later US patents
- Tandem linear scanning confocal imaging system with focal volumes at different heights499US 5,248,876 AInternational Business Machines Corporation · 1993
- In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing472US 5,433,651 AInternational Business Machines Corporation · 1995
- Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus396US 5,893,796 AAPPLIED Materials.Inc. · 1999
- Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness321US 5,486,701 APrometrix Corporation · 1996
- Optoelectronic distance sensor with visible pilot beam270US 4,825,091 ACarl-Zeiss-Stiftung · 1989