G01B 11/0608
Height gauges
Official title: {Height gauges}
G01B11/0608 (Height gauges) appears on 874 US grants and 1,009 published applications in this corpus.
Search patents in G01B- Granted patents
- 874
- Published applications
- 1,009
- Assignees
- 540
- Inventors
- 2,158
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 5 | 0 |
| 1978 | 2 | 0 |
| 1979 | 3 | 0 |
| 1980 | 3 | 0 |
| 1981 | 7 | 0 |
| 1982 | 2 | 0 |
| 1983 | 2 | 0 |
| 1984 | 0 | 0 |
| 1985 | 3 | 0 |
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 3 | 0 |
| 1989 | 4 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 3 | 0 |
| 1994 | 5 | 0 |
| 1995 | 4 | 0 |
| 1996 | 3 | 0 |
| 1997 | 5 | 0 |
| 1998 | 5 | 0 |
| 1999 | 11 | 0 |
| 2000 | 6 | 0 |
| 2001 | 7 | 2 |
| 2002 | 7 | 10 |
| 2003 | 8 | 5 |
| 2004 | 8 | 20 |
| 2005 | 12 | 6 |
| 2006 | 8 | 7 |
| 2007 | 9 | 11 |
| 2008 | 8 | 24 |
| 2009 | 17 | 18 |
| 2010 | 11 | 23 |
| 2011 | 10 | 29 |
| 2012 | 16 | 30 |
| 2013 | 25 | 21 |
| 2014 | 23 | 33 |
| 2015 | 17 | 36 |
| 2016 | 28 | 36 |
| 2017 | 35 | 58 |
| 2018 | 52 | 71 |
| 2019 | 82 | 61 |
| 2020 | 63 | 71 |
| 2021 | 51 | 93 |
| 2022 | 69 | 93 |
| 2023 | 57 | 75 |
| 2024 | 65 | 58 |
| 2025 | 64 | 56 |
| 2026 | 36 | 62 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Predictive biomass map generation and control6 Oct 2026US 12,751,362 B2Deere & Company
- Height measurement sensor using derivative of periodic points22 Sep 2026US 12,742,636 B2ASML Netherlands B. V.
- Systems and methods of measuring sample thickness25 Aug 2026US 12,716,710 B210x Genomics, Inc.
- Method and device for determining geometric information relating to interfaces of an optical element25 Aug 2026US 12,716,808 B2Fogale Nanotech
- Low-bulk interferometric sensor11 Aug 2026US 12,704,369 B2Sciences Et Techniques Industrielles De La Lumiere
- Device for measuring the flatness of a surface or the thickness of a flat glass panel8 Oct 2026US 2026/0309481 A1
- System and method for inspection and metrology of three-dimensional features1 Oct 2026US 2026/0298619 A1Orbotech Ltd.
- Measuring apparatus and method for controlling measuring apparatus1 Oct 2026US 2026/0298620 A1Lasertec Corporation
- Metrology apparatus and metrology methods based on high harmonic generation from a diffractive structure1 Oct 2026US 2026/0298820 A1ASML Netherlands B. V.
- System for determining the volume and the free floor area in a loading zone and corresponding control method1 Oct 2026US 2026/0299129 A1Innovaction Technologies
Most cited
By later US patents
- Tandem linear scanning confocal imaging system with focal volumes at different heights499US 5,248,876 AInternational Business Machines Corporation · 1993
- Optoelectronic distance sensor with visible pilot beam270US 4,825,091 ACarl-Zeiss-Stiftung · 1989
- 3-D camera for recording surface structures, in particular for dental purposes237US 6,885,464 B1Sirona Dental Systems GmbH · 2005
- Z-axis height measurement system207US 4,743,771 AView Engineering, Inc. · 1988
- System for dimensioning objects163US 5,555,090 AAdaptive Optics Associates, Inc. · 1996