Measuring apparatus and method for controlling measuring apparatus
AssigneeLasertec Corporation
InventorsYoshihiro NISHIMURA, Shoichi SHIMODA
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AssigneeLasertec Corporation
InventorsYoshihiro NISHIMURA, Shoichi SHIMODA
Estimating the term…
A measuring apparatus includes: a phase shifting mechanism configured to generate a plurality of optical path differences between a first optical path and a second optical path; and a standard tilt acquisition unit configured to acquire a standard tilt of the sample, wherein: the photodetector is configured to detect the interference light at the plurality of optical path differences; and the standard tilt acquisition unit is configured to: acquire height information at a plurality of measurement points on the sample based on a result of the detection of the interference light at the plurality of optical path differences; acquire tilt information between measurement points based on the height information at the plurality of measurement points; and acquire the standard tilt based on statistical processing performed for a plurality of pieces of tilt information.
A measuring apparatus comprising:
A method for controlling a measuring apparatus, the measuring apparatus comprising:
Dependencies are inferred from the claim text.