System for measuring optical pulse time-of-flight
AssigneeKorea Advanced Institute of Science and Technology
InventorsJungwon KIM, Hyoungsu CHOI
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AssigneeKorea Advanced Institute of Science and Technology
InventorsJungwon KIM, Hyoungsu CHOI
Estimating the term…
A system for measuring a thickness of an object is provided. The system includes an optical signal generator configured to generate an optical pulse train, a coupler configured to split the optical pulse train into a first optical signal and a second optical signal, a sensor including a collimator configured to cause the second optical signal to be incident on the object at substantially a Brewster angle, and to receive the second optical signal reflected from a mirror and emitted through the object, and the mirror configured to reflect the second optical signal passing through the object to the object at substantially the Brewster angle, and a timing detector configured to output a timing error based on a phase difference between the first optical signal and the reflected second optical signal.
A system for measuring a thickness of an object, the system comprising:
A system for measuring a thickness of an object, the system comprising:
Dependencies are inferred from the claim text.