B81C 99/0035
Testing
Official title: {Testing}
B81C99/0035 (Testing) appears on 242 US grants and 262 published applications in this corpus.
Search patents in B81C- Granted patents
- 242
- Published applications
- 262
- Assignees
- 139
- Inventors
- 601
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 0 |
| 2002 | 3 | 3 |
| 2003 | 6 | 5 |
| 2004 | 8 | 8 |
| 2005 | 6 | 14 |
| 2006 | 8 | 11 |
| 2007 | 5 | 16 |
| 2008 | 11 | 15 |
| 2009 | 11 | 13 |
| 2010 | 8 | 16 |
| 2011 | 9 | 12 |
| 2012 | 12 | 7 |
| 2013 | 12 | 19 |
| 2014 | 12 | 14 |
| 2015 | 11 | 18 |
| 2016 | 17 | 10 |
| 2017 | 17 | 15 |
| 2018 | 12 | 12 |
| 2019 | 18 | 5 |
| 2020 | 7 | 8 |
| 2021 | 5 | 9 |
| 2022 | 9 | 11 |
| 2023 | 6 | 1 |
| 2024 | 7 | 6 |
| 2025 | 3 | 9 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Movable device, MEMS device and optical scanning apparatus8 Sep 2026US 12,730,301 B2Mitsumi Electric Co., Ltd.
- Method for manufacturing mirror device23 Jun 2026US 12,662,373 B2Hamamatsu Photonics K.K.
- Circuit and method to detect faults of a MEMS device including an oscillating mass5 May 2026US 12,620,935 B2STMicroelectronics International N. V.
- Lensless near-contact imaging system for micro assembly18 Nov 2025US 12,477,237 B2Xerox Corporation
- Methods and apparatuses for acoustically testing MEMS devices13 May 2025US 12,298,341 B2Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V.
- Method for manufacturing a microelectromechanical system mirror device, manufacturing apparatus, set of mirror devices and wafer7 May 2026US 2026/0125262 A1Infineon Technologies AG
- Microstructure inspection device and system and use of the same26 Mar 2026US 2026/0086115 A1Silex Microsystems AB
- Lensless near-contact imaging system for micro assembly12 Mar 2026US 2026/0075327 A1Genesee Valley Innovations, LLC
- Calibration device15 Jan 2026US 2026/0016358 A1NXP USA, Inc.
- Drop test device for a micromechanical component8 Jan 2026US 2026/0008671 A1
Most cited
By later US patents
- MEMS process and device157US 7,781,249 B2Wolfson Microelectronics plc · 2010
- Monolithic accelerometer153US 5,345,824 AAnalog Devices, Inc. · 1994
- MEMS process and device117US 7,856,804 B2Wolfson Microelectronics plc · 2010
- Monolithic accelerometer113US 5,540,095 AAnalog Devices, Inc. · 1996
- Pulsed ion beam control of solid state features103US 7,118,657 B2President and Fellows of Harvard College · 2006