Methods and apparatuses for acoustically testing MEMS devices

A method for acoustically testing at least one MEMS device:

• providing the at least one MEMS device,
• exciting the at least one MEMS device to an acoustic vibration,
• detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor,
• evaluating the acoustic vibration of the at least one MEMS device, detected by the at least one sound sensor, to test the at least one MEMS device as to an intended functionality,
• providing a first test apparatus and contacting via electrical contacts a first side of the at least one MEMS device by the first test apparatus, wherein the at least one MEMS device is excited via the electrical contacts of the first test apparatus,
• providing a second test apparatus and contacting a second side of the at least one MEMS device opposite the first side by the second test apparatus, wherein the second test apparatus comprises the at least one sound sensor.

A method for acoustically testing at least one MEMS device:

• providing the at least one MEMS device,
• providing a test apparatus and contacting the at least one MEMS device by the test apparatus via electrical contacts,
• exciting the at least one MEMS device to an acoustic vibration via the electrical contacts,
• detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor,
• evaluating the acoustic vibration of the at least one MEMS device, detected by the at least one sound sensor, to test the at least one MEMS device as to an intended functionality,
• wherein the at least one MEMS device is a group of MEMS devices,
• wherein the group of MEMS devices is excited to acoustic vibrations,
• wherein the acoustic vibrations of the group of MEMS devices are detected by the at least one sound sensor,
• wherein the at least one sound sensor comprises a plurality of sound sensors, wherein one sound sensor each of the plurality of sound sensors is associated to an MEMS device of the group of MEMS devices,
• or wherein the at least one sound sensor comprises a plurality of sound sensor arrays, wherein one sound sensor array each of the plurality of sound sensor arrays is associated to a MEMS device of the group of MEMS devices.

A method for acoustically testing at least one MEMS device of an integrated circuit or chip during manufacturing of the integrated circuit or chip:

• providing a partial product of the integrated circuit or chip with the at least one MEMS device,
• providing a test apparatus and contacting the at least one MEMS device by the test apparatus via electrical contacts,
• exciting the at least one MEMS device to an acoustic vibration via the electrical contacts,
• detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor,
• evaluating the acoustic vibration of the at least one MEMS device, detected by the at least one sound sensor, to test the at least one MEMS device as to an intended functionality.

A non-transitory digital storage medium having a computer program stored thereon to perform the method for acoustically testing at least one MEMS device of a plurality of MEMS devices, wherein the method comprises:

• providing the plurality of MEMS devices with the at least one MEMS device to be acoustically tested,
• providing a test apparatus and contacting the at least one MEMS device by the test apparatus via electrical contacts,
• exciting the at least one MEMS device via the electrical contacts of the test apparatus to an acoustic vibration,
• detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor of the test apparatus,
• evaluating the acoustic vibration of the at least one MEMS device, detected by the at least one sound sensor, to test the at least one MEMS device as to an intended functionality,
• wherein the test apparatus is a probe, part of a probe or a test card,
• when said computer program is run by a computer.

A test apparatus for acoustically testing at least one MEMS device of a plurality of MEMS devices arranged on a wafer,

• wherein the test apparatus is configured to contact at least one MEMS device of the plurality of MEMS devices arranged on the wafer via electrical contacts,
• wherein the test apparatus is configured to excite the at least one MEMS device to an acoustic vibration via the electrical contacts,
• wherein the test apparatus comprises at least one sound sensor configured to detect the acoustic vibration of the at least one MEMS device,
• wherein the test apparatus is configured to provide at least one signal which is dependent on the acoustic vibration of the at least one MEMS device detected by the sound sensor,
• wherein the test apparatus is a probe, part of a probe or a test card.

An apparatus for acoustically testing at least one MEMS device of a plurality of MEMS devices arranged on a wafer,

• wherein the apparatus comprises a first test apparatus and a second test apparatus,
• wherein the first test apparatus is configured to contact a first side of the at least one MEMS device of the plurality of MEMS devices arranged on the wafer via electrical contacts,
• wherein the first test apparatus is configured to excite the at least one MEMS device to an acoustic vibration via the electrical contacts,
• wherein the second test apparatus is configured to contact a second side of the at least one MEMS device opposite the first side,
• wherein the second test apparatus comprises at least one sound sensor configured to detect the acoustic vibration of the at least one MEMS device,
• wherein the apparatus is configured to evaluate the acoustic vibration of the at least one MEMS device detected by the at least one sound sensor to test the at least one MEMS device as to an intended functionality.