H01J 37/2955
Using scanning ray
Official title: {using scanning ray}
H01J37/2955 (Using scanning ray) appears on 47 US grants and 39 published applications in this corpus.
Search patents in H01J- Granted patents
- 47
- Published applications
- 39
- Assignees
- 35
- Inventors
- 119
- Latest grant
- 17 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 1 | 1 |
| 2004 | 2 | 2 |
| 2005 | 1 | 0 |
| 2006 | 1 | 3 |
| 2007 | 1 | 1 |
| 2008 | 2 | 0 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 3 |
| 2012 | 1 | 1 |
| 2013 | 2 | 1 |
| 2014 | 2 | 1 |
| 2015 | 1 | 1 |
| 2016 | 1 | 2 |
| 2017 | 1 | 0 |
| 2018 | 0 | 2 |
| 2019 | 0 | 3 |
| 2020 | 11 | 5 |
| 2021 | 1 | 3 |
| 2022 | 2 | 1 |
| 2023 | 1 | 4 |
| 2024 | 0 | 2 |
| 2025 | 2 | 2 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Charged particle gun, charged particle beam system, and lock nut17 Jun 2025US 12,334,298 B2Hitachi High-Tech Corporation
- Charged particle beam apparatus22 Apr 2025US 12,283,452 B2Hitachi High-Tech Corporation
- Methods and systems for acquiring three-dimensional electron diffraction data14 Nov 2023US 11,815,476 B2FEI Company
- Method of acquiring dark-field image4 Oct 2022US 11,462,384 B2JEOL Ltd.
- Kikuchi diffraction detector12 Apr 2022US 11,300,530 B2Bruker Nano, Inc.
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- Charged Particle Beam Apparatus6 Mar 2025US 2025/0079112 A1Hitachi High-Tech Corporation
- Differential phase contrast microanalysis using energy loss spectrometers27 Feb 2025US 2025/0069847 A1FEI Company
- Five-dimensional electron microscope and analysis method therefor28 Nov 2024US 2024/0395499 A1Rinken
- Charged-particle beam device for diffraction analysis24 Oct 2024US 2024/0355577 A1
Most cited
By later US patents
- Transmission-type scanning charged-particle beam microscope41US 4,211,924 ASiemens Aktiengesellschaft · 1980
- Differential phase contrast scanning transmission electron microscope30US 5,004,918 AJEOL Ltd. · 1991
- Apparatus and method for e-beam dark imaging with perspective control25US 7,838,833 B1KLA-Tencor Technologies Corporation · 2010
- Crystal phase identification20US 6,326,619 B1Sandia Corporation · 2001
- Observation apparatus and observation method using an electron beam17US 6,750,451 B2Hitachi, Ltd. · 2004