H01J 37/295
Electron or ion diffraction tubes
H01J37/295 (Electron or ion diffraction tubes) appears on 144 US grants and 131 published applications in this corpus.
Search patents in H01J- Granted patents
- 144
- Published applications
- 131
- Assignees
- 78
- Inventors
- 318
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 1 |
| 2003 | 2 | 1 |
| 2004 | 3 | 3 |
| 2005 | 2 | 0 |
| 2006 | 1 | 5 |
| 2007 | 2 | 5 |
| 2008 | 5 | 5 |
| 2009 | 3 | 5 |
| 2010 | 4 | 3 |
| 2011 | 5 | 9 |
| 2012 | 4 | 4 |
| 2013 | 7 | 4 |
| 2014 | 9 | 6 |
| 2015 | 5 | 5 |
| 2016 | 2 | 5 |
| 2017 | 3 | 6 |
| 2018 | 4 | 4 |
| 2019 | 3 | 11 |
| 2020 | 20 | 16 |
| 2021 | 12 | 4 |
| 2022 | 7 | 6 |
| 2023 | 3 | 9 |
| 2024 | 5 | 9 |
| 2025 | 5 | 2 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System and method for fully integrated microcrystal electron diffraction (MicroED)6 Oct 2026US 12,755,925 B2The Regents of the University of California
- Transmission electron microscope25 Aug 2026US 12,719,011 B2Hitachi High-Tech Corporation
- Electron microscope analysis system4 Nov 2025US 12,463,007 B2Riken
- Spin-resolved ultrafast electron diffraction7 Oct 2025US 12,436,117 B2University of Houston System
- Microscopic specimen and analysis method thereof using microscope2 Sep 2025US 12,406,827 B2Sogang University Research & Business Development Foundation
- Rapid mode switching of charged-particle-beam devices13 Aug 2026US 2026/0237595 A1
- Methods of operating a charged particle microscope system including a beam deflector and associated systems5 Feb 2026US 2026/0038764 A1FEI Company
- High temperature nv center sensing up to 1400k22 Jan 2026US 2026/0024718 A1The Chinese University of Hong Kong
- Charged Particle Beam Apparatus6 Mar 2025US 2025/0079112 A1Hitachi High-Tech Corporation
- Differential phase contrast microanalysis using energy loss spectrometers27 Feb 2025US 2025/0069847 A1FEI Company
Most cited
By later US patents
- Transmission-type scanning charged-particle beam microscope41US 4,211,924 ASiemens Aktiengesellschaft · 1980
- Differential phase contrast scanning transmission electron microscope30US 5,004,918 AJEOL Ltd. · 1991
- Method of three-dimensional atomic imaging29US 5,095,207 AUniversity of Wisconsin - Milwaukee · 1992
- Apparatus and method for e-beam dark imaging with perspective control25US 7,838,833 B1KLA-Tencor Technologies Corporation · 2010
- Crystal phase identification20US 6,326,619 B1Sandia Corporation · 2001