Spin-resolved ultrafast electron diffraction
AssigneeUniversity of Houston System
InventorByron Freelon
Life of this patent
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Abstract
A device and system for ultrafast electron diffraction is disclosed. The electron diffraction device includes an electron source, anode, and magnetic lens. A laser probe pulse interacts with electrons from the electron source to generate an electron probe pulse that passes through the anode and diffracts from a sample yielding a diffraction pattern. Data is configured to be collected at one instance using the diffraction pattern to yield a first snapshot of diffractive information. Snapshots may be merged to produce an atomic stroboscopic motion image history of atomic lattice changes. The electron source may include a gas jet with photo-ionizable noble gas atoms to produce photoionized, spin-polarized electrons to form the electron probe pulse when the laser probe pulse impinges upon the electron source.
Claims18
An electron diffraction device comprising:
- an electron source, wherein the electron source comprises a gas jet comprising photo-ionizable noble gas atoms that produce photoionized, spin-polarized electrons to form an electron probe pulse when a laser probe pulse impinges upon the electron source;
- and
- an anode,
- wherein the laser probe pulse interacts with electrons from the electron source to generate the electron probe pulse that passes through the anode and diffracts from a sample yielding a diffraction pattern;
- and
- wherein data is configured to be collected at one instance using the diffraction pattern to yield a first snapshot of diffractive information.
An ultrafast electron diffraction system comprising:
- an ultrafast laser that generates a laser beam;
- a beam splitter configured to split the laser beam into a laser pump pulse and a laser probe pulse;
- a sample stage configured to hold a sample, wherein the laser pump pulse is configured to excite the sample;
- a delay stage to modify a distance the laser pump pulse travels from the beam splitter to the sample to establish a delay time between the laser pump pulse and an electron probe pulse;
- an electron diffraction device comprising:
- an electron source, wherein the electron source comprises a gas jet comprising photo-ionizable noble gas atoms that produce photoionized, spin-polarized electrons to form the electron probe pulse when the laser probe pulse impinges upon the electron source;
- and
- an anode,
- wherein the laser probe pulse interacts with electrons from the electron source to generate the electron probe pulse that passes through the anode and diffracts from the sample yielding a diffraction pattern;
- and
- wherein data is configured to be collected at one instance using the diffraction pattern to yield a first snapshot of diffractive information.
Dependencies are inferred from the claim text.