Method of acquiring dark-field image

A method of acquiring a dark-field image acquired by scanning an electron beam over a specimen for a scanning transmission electron microscope,

• the scanning transmission electron microscope comprising:
• a dark-field detector having an annular detection region configured to detect electrons scattered at a specimen in a predetermined angular range;
• an objective lens;
• an imaging lens group disposed at a stage following the objective lens;
• a scanning deflector that scans the electron beam over the specimen;
• and
• an imaging system deflector that deflects the electron beam transmitted through the specimen,
• the method comprising:
• causing the electrons scattered in the predetermined angular range to enter the dark-field detector by correcting a difference in a focus position that depends on an angle generated by a geometrical aberration between the electrons scattered in the predetermined angular range by defocus generated by shifting a focus of the imaging lens group from a diffraction plane of the objective lens according to the magnitude of the geometrical aberration;
• and
• correcting, with use of the imaging system deflector and along with the scanning of the electron beam, a deviation of the electron beam from an optical axis generated by scanning the electron beam over the specimen while shifting the focus of the imaging lens group from the diffraction plane of the objective lens.