H01J 2237/31745
For preparing specimen to be viewed in microscopes or analyzed in microanalysers
Official title: for preparing specimen to be viewed in microscopes or analyzed in microanalysers
H01J2237/31745 (For preparing specimen to be viewed in microscopes or analyzed in microanalysers) appears on 503 US grants and 589 published applications in this corpus.
Search patents in H01J- Granted patents
- 503
- Published applications
- 589
- Assignees
- 115
- Inventors
- 775
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 0 |
| 2002 | 2 | 7 |
| 2003 | 5 | 4 |
| 2004 | 5 | 11 |
| 2005 | 8 | 15 |
| 2006 | 14 | 33 |
| 2007 | 12 | 22 |
| 2008 | 25 | 31 |
| 2009 | 16 | 24 |
| 2010 | 20 | 26 |
| 2011 | 21 | 21 |
| 2012 | 31 | 23 |
| 2013 | 26 | 39 |
| 2014 | 39 | 25 |
| 2015 | 21 | 32 |
| 2016 | 31 | 26 |
| 2017 | 25 | 19 |
| 2018 | 27 | 21 |
| 2019 | 22 | 28 |
| 2020 | 28 | 27 |
| 2021 | 25 | 18 |
| 2022 | 23 | 23 |
| 2023 | 15 | 31 |
| 2024 | 16 | 29 |
| 2025 | 17 | 27 |
| 2026 | 15 | 27 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of sample preparation and analysis25 Aug 2026US 12,719,012 B2FEI Company
- Method for preparing a microscopic sample for FIB/SEM tomography23 Jun 2026US 12,665,165 B2Carl Zeiss Microscopy GmbH
- Ion milling apparatus16 Jun 2026US 12,658,399 B2Hitachi High-Tech Corporation
- Sample carrier for use in a charged particle microscope, and a method of using such a sample carrier in a charged particle microscope12 May 2026US 12,626,882 B2FEI Company
- Apparatus and method for manipulating a microscopic sample12 May 2026US 12,626,883 B2FEI Company
- Adaptive illumination for a dual beam system10 Sep 2026US 2026/0269178 A1FEI Company
- Application Management For Charged Particle Microscope Devices10 Sep 2026US 2026/0269180 A1
- Workstation, preparation station and method for manipulating an electron microscopy grid assembly3 Sep 2026US 2026/0260839 A1Max-Planck-Gesellschaft Zur FöRderung Der Wissenschaften E. V.
- Charged Particle Beam Device and Method for Producing and Observing Sample Piece6 Aug 2026US 2026/0229446 A1Hitachi High-Tech Corporation
- Charged particle beam device and method for controlling charged particle beam device6 Aug 2026US 2026/0229452 A1Hitachi High-Tech Analysis Corporation
Most cited
By later US patents
- Method and apparatus for sample fabrication177US 6,538,254 B1Hitachi, Ltd. · 2003
- Manipulator for microscopy sample preparation and methods for making and use thereof170US 7,041,985 B1Western Digital (Fremont), LLC · 2006
- Precise metrology with adaptive milling154US 8,222,599 B1Western Digital (Fremont), LLC · 2012
- Lift-out probe having an extension tip, methods of making and using, and analytical instruments employing same98US 7,009,188 B2Micron Technology, Inc. · 2006
- Ion beam milling system and method for electron microscopy specimen preparation93US 6,914,244 B2Ropintassco Holdings, L.P. · 2005