Application Management For Charged Particle Microscope Devices
OwnerPavel Potocek, Maurice Peemen +1inventors
InventorsPavel Potocek, Maurice Peemen, Remco Schoenmakers
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OwnerPavel Potocek, Maurice Peemen +1inventors
InventorsPavel Potocek, Maurice Peemen, Remco Schoenmakers
Estimating the term…
Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, an example method may comprise receiving, by a first device located at a premises and from a second device located external to the premises, and via a network, configuration data for a charged particle microscope located at the premises. The method may comprise updating, by the first device and based on the configuration data, one or more configuration settings associated with the charged particle microscope. The method may comprise causing, based on the updated one or more configuration settings, one or more operations associated with the charged particle microscope to be performed.
A method comprising:
A first device comprising:
A non-transitory computer-readable medium comprising a set of computer-executable instructions that, when executed by one or more processors, cause:
Dependencies are inferred from the claim text.