H01J 2237/3114
Machining
H01J2237/3114 (Machining) appears on 53 US grants and 57 published applications in this corpus.
Search patents in H01J- Granted patents
- 53
- Published applications
- 57
- Assignees
- 37
- Inventors
- 131
- Latest grant
- 30 Sep 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 1 |
| 2003 | 2 | 0 |
| 2004 | 2 | 1 |
| 2005 | 0 | 8 |
| 2006 | 4 | 6 |
| 2007 | 3 | 1 |
| 2008 | 5 | 4 |
| 2009 | 1 | 2 |
| 2010 | 1 | 3 |
| 2011 | 3 | 1 |
| 2012 | 1 | 5 |
| 2013 | 3 | 2 |
| 2014 | 1 | 0 |
| 2015 | 1 | 2 |
| 2016 | 1 | 2 |
| 2017 | 2 | 3 |
| 2018 | 6 | 5 |
| 2019 | 3 | 3 |
| 2020 | 3 | 1 |
| 2021 | 0 | 1 |
| 2022 | 1 | 1 |
| 2023 | 1 | 3 |
| 2024 | 1 | 1 |
| 2025 | 3 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Specimen machining device and specimen machining method30 Sep 2025US 12,429,333 B2JEOL Ltd.
- Ion milling device18 Feb 2025US 12,230,471 B2Hitachi High-Tech Corporation
- Systems and methods for optimizing full horizontal scanned beam distance7 Jan 2025US 12,191,113 B2APPLIED Materials.Inc.
- Ion milling device6 Feb 2024US 11,894,213 B2Hitachi High-Tech Corporation
- Method for controlling dynamically controllable ultrawide-amplitude and high-response ion source23 May 2023US 11,658,005 B2National University of Defense Technology, People's Liberation Army of China
- Electron beam device for surface treatment16 Oct 2025US 2025/0323006 A1
- Apparatus and Method for Fabrication of Shield Plate27 Jun 2024US 2024/0208762 A1JEOL Ltd.
- Systems and methods for optimizing full horizontal scanned beam distance30 Nov 2023US 2023/0386785 A1APPLIED Materials.Inc.
- Ion Milling Device16 Feb 2023US 2023/0048299 A1Hitachi High-Tech Corporation
- Specimen Machining Device and Specimen Machining Method19 Jan 2023US 2023/0015109 A1JEOL Ltd.
Most cited
By later US patents
- Method for making specimen and apparatus thereof77US 5,656,811 AHitachi, Ltd. · 1997
- Method and apparatus for specimen fabrication73US 6,664,552 B2Hitachi, Ltd. · 2003
- Ion beam apparatus and sample processing method30US 7,084,399 B2Hitachi, Ltd. · 2006
- Method and apparatus for energy beam machining27US 5,770,123 AEbara Corporation · 1998
- Slotted antenna waveguide plasma source17US 7,305,935 B1The United States of America as represented by the Administration of NASA · 2007