G06F 2119/22
Yield analysis or yield optimisation
G06F2119/22 (Yield analysis or yield optimisation) appears on 128 US grants and 169 published applications in this corpus.
Search patents in G06F- Granted patents
- 128
- Published applications
- 169
- Assignees
- 98
- Inventors
- 583
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 0 | 2 |
| 2012 | 2 | 2 |
| 2013 | 2 | 0 |
| 2014 | 3 | 4 |
| 2015 | 2 | 5 |
| 2016 | 1 | 1 |
| 2017 | 5 | 4 |
| 2018 | 2 | 4 |
| 2019 | 5 | 7 |
| 2020 | 17 | 17 |
| 2021 | 13 | 20 |
| 2022 | 7 | 26 |
| 2023 | 20 | 16 |
| 2024 | 13 | 19 |
| 2025 | 14 | 23 |
| 2026 | 19 | 16 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Mask optimization for layer accounting for overlap with other layers6 Oct 2026US 12,754,471 B2D2S, Inc.
- Mask optimization for layer based on comparison of components in layer to components in other layers6 Oct 2026US 12,754,472 B2D2S, Inc.
- Mask optimization preferentially accounting for overlap regions6 Oct 2026US 12,754,473 B2D2S, Inc.
- Concurrent mask optimization for multiple layers6 Oct 2026US 12,754,474 B2D2S, Inc.
- Machine learning based metrology for semiconductor specimens6 Oct 2026US 12,754,484 B2Applied Materials Israel Ltd.
- Mask optimization accounting for more critical and less critical overlap regions8 Oct 2026US 2026/0310067 A1D2S, Inc.
- System for monitoring semiconductor process based on digital twin10 Sep 2026US 2026/0267766 A1Inha University Research and Business Foundation
- System and methods for simulation of medical devices20 Aug 2026US 2026/0244822 A1Regeneron Pharmaceuticals, Inc.
- Electronic device and method13 Aug 2026US 2026/0236643 A1Samsung Electronics Co., Ltd.
- Systems and methods for printed circuit board netlist extraction from multimodal imagery13 Aug 2026US 2026/0237225 A1
Most cited
By later US patents
- Method for manufacturing test simulation in electronic circuit design195US 5,539,652 AHewlett-Packard Company · 1996
- Method and system for improving a part's resistance to stress induced failure15US 7,219,044 B1Surface Technology Holdings, Ltd. · 2007
- Cut mask aware contact enclosure rule for grating and cut patterning solution12US 8,918,746 B1Globalfoundries Inc. · 2014
- Machine-learning design enablement platform10US 10,678,973 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2020
- System and method for forecasting production from a hydrocarbon reservoir9US 9,043,188 B2Chevron U.S.A.Inc. · 2015