G01R 31/287
Procedures
Official title: {Procedures; Software aspects}
G01R31/287 (Procedures) appears on 232 US grants and 235 published applications in this corpus.
Search patents in G01R- Granted patents
- 232
- Published applications
- 235
- Assignees
- 117
- Inventors
- 576
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 5 | 0 |
| 1999 | 3 | 0 |
| 2000 | 5 | 0 |
| 2001 | 6 | 1 |
| 2002 | 7 | 10 |
| 2003 | 11 | 12 |
| 2004 | 17 | 16 |
| 2005 | 12 | 7 |
| 2006 | 13 | 5 |
| 2007 | 6 | 12 |
| 2008 | 7 | 11 |
| 2009 | 6 | 4 |
| 2010 | 3 | 3 |
| 2011 | 4 | 3 |
| 2012 | 3 | 5 |
| 2013 | 5 | 5 |
| 2014 | 4 | 5 |
| 2015 | 3 | 4 |
| 2016 | 4 | 5 |
| 2017 | 4 | 4 |
| 2018 | 7 | 14 |
| 2019 | 6 | 6 |
| 2020 | 10 | 11 |
| 2021 | 8 | 17 |
| 2022 | 13 | 14 |
| 2023 | 17 | 9 |
| 2024 | 14 | 25 |
| 2025 | 13 | 14 |
| 2026 | 6 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test system for detecting faults in multiple devices of the same type5 May 2026US 12,618,895 B2NXP B. V.
- Systems and methods for testing optical communication devices28 Apr 2026US 12,613,271 B2O-Net Communications Limited
- Peak power package tracking3 Mar 2026US 12,566,211 B2Advanced Micro Devices, Inc.
- Systems and methods for testing functionality and performance of a sensor and hub24 Feb 2026US 12,560,645 B2The ADT Security Corporation
- Control of an automated test equipment based on temperature10 Feb 2026US 12,546,814 B2Advantest Corporation
- Configuration of parallel testing systems24 Sep 2026US 2026/0287644 A1Chroma Ate Inc.
- Method and system for testing the resilience of an electronic device that in use is subjected to periodic deformations17 Sep 2026US 2026/0276699 A1
- Test circuitry for ring amplifier17 Sep 2026US 2026/0276700 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Control of an automated test equipment based on temperature13 Aug 2026US 2026/0235661 A1Advantest Corporation
- Real-time throttling for testing of semiconductor devices30 Jul 2026US 2026/0219311 A1Advantest Corporation
Most cited
By later US patents
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992
- Method of temporarily, then permanently, connecting to a semiconductor device126US 5,983,493 AFormFactor, Inc. · 1999
- E10 reporting tool108US 5,740,429 AAdvanced Micro Devices, Inc. · 1998
- Wafer-level burn-in and test105US 6,525,555 B1FormFactor, Inc. · 2003
- Temperature control of electronic devices using power following feedback94US 6,489,793 B2Delta Design, Inc. · 2002