Systems and methods for testing optical communication devices
AssigneeO-Net Communications Limited
InventorsBouchaib Hraimel, Zining Huang
Life of this patent
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Abstract
A test system for a device under test (DUT) includes an arm to hold the DUT, the arm having a predetermined heat capacity to act as a heat sink for the DUT; spring pins each to secure the DUT pins to pads on a test board, each pin supporting a 90 gigahertz bandwidth; and an actuator coupled to the arm to align the DUT over a test board on a horizontal X-axis and a vertical Y-axis, the actuator providing a compressive Z-axis force on the DUT to electrically couple the DUT to the test board.
Claims16
A test system for a device under test (DUT), comprising:
- an arm to hold the DUT, the arm having a predetermined heat capacity to act as a heat sink for the DUT;
- spring pins each to secure the DUT pins to pads on a test board, each pin supporting at least a 90 gigahertz bandwidth, wherein the spring pin comprises a top plunger element defining an electrical contact at one end, and a plunger at an opposed end;
- and
- an actuator coupled to the arm to align the DUT over a test board on a horizontal X-axis and a vertical Y-axis, the actuator providing a compressive Z-axis force on the DUT to electrically couple the DUT to the test board.
A method to test for a device under test (DUT), comprising:
- securing the DUT to an arm having a predetermined heat capacity to act as a heat sink for the DUT;
- moving the arm to align the DUT over a test board on a horizontal X-axis and a vertical Y-axis with an actuator;
- positioning the arm based on a video feedback loop;
- and
- applying a compressive Z-axis force on the DUT to electrically couple the DUT to a test board with flexible pins to secure the DUT pins to pads on the test board, each pin supporting at least a 90 gigahertz bandwidth.
Dependencies are inferred from the claim text.