Systems and methods for testing functionality and performance of a sensor and hub
AssigneeThe ADT Security Corporation
InventorJeron E. Bornstein
Life of this patent
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AssigneeThe ADT Security Corporation
InventorJeron E. Bornstein
Estimating the term…
A system for testing a sensor and a hub is provided. The system includes a testing control device and a sensor testing device. The testing control device is configured to select a testing profile based at least in part on the sensor, and transmit a testing initiation signal based at least in part on the testing profile. The sensor testing device is configured to perform testing of the sensor and the hub in response to the testing initiation signal, the testing including rotating the sensor along at least one axis based at least in part on the testing profile, and transmit test data to the testing control device based at least in part on the testing of the sensor and the hub. The testing control device is configured to receive the test data from the sensor testing device.
A system for testing a sensor and a hub, the system comprising:
A system for testing a sensor and a hub, the system comprising:
Dependencies are inferred from the claim text.