G01R 31/2806
Apparatus therefor
Official title: {Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence)}
G01R31/2806 (Apparatus therefor) appears on 780 US grants and 666 published applications in this corpus.
Search patents in G01R- Granted patents
- 780
- Published applications
- 666
- Assignees
- 425
- Inventors
- 1,770
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 4 | 0 |
| 1978 | 4 | 0 |
| 1979 | 3 | 0 |
| 1980 | 5 | 0 |
| 1981 | 4 | 0 |
| 1982 | 5 | 0 |
| 1983 | 3 | 0 |
| 1984 | 8 | 0 |
| 1985 | 2 | 0 |
| 1986 | 2 | 0 |
| 1987 | 5 | 0 |
| 1988 | 7 | 0 |
| 1989 | 14 | 0 |
| 1990 | 4 | 0 |
| 1991 | 14 | 0 |
| 1992 | 8 | 0 |
| 1993 | 7 | 0 |
| 1994 | 4 | 0 |
| 1995 | 10 | 0 |
| 1996 | 11 | 0 |
| 1997 | 6 | 0 |
| 1998 | 18 | 0 |
| 1999 | 14 | 0 |
| 2000 | 21 | 0 |
| 2001 | 25 | 10 |
| 2002 | 27 | 21 |
| 2003 | 23 | 22 |
| 2004 | 19 | 41 |
| 2005 | 25 | 28 |
| 2006 | 32 | 28 |
| 2007 | 21 | 21 |
| 2008 | 21 | 24 |
| 2009 | 19 | 26 |
| 2010 | 11 | 25 |
| 2011 | 19 | 28 |
| 2012 | 18 | 22 |
| 2013 | 16 | 26 |
| 2014 | 26 | 26 |
| 2015 | 18 | 19 |
| 2016 | 26 | 23 |
| 2017 | 19 | 24 |
| 2018 | 18 | 31 |
| 2019 | 36 | 30 |
| 2020 | 29 | 27 |
| 2021 | 31 | 31 |
| 2022 | 27 | 22 |
| 2023 | 21 | 29 |
| 2024 | 28 | 32 |
| 2025 | 22 | 30 |
| 2026 | 17 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Testing a circuit board6 Oct 2026US 12,754,230 B2Teradyne, Inc.
- Longitudinally shiftable electrically conductive contact device22 Sep 2026US 12,742,813 B2Feinmetall GmbH
- Low profile electronic testing system with flexible test PCB format25 Aug 2026US 12,716,913 B2Modus Test, LLC
- Diagnostic device18 Aug 2026US 12,710,472 B2The Boeing Company
- Multiple tile motherboard tester7 Jul 2026US 12,674,836 B2Intelligent Memory Limited
- Programmable compensating probe attachment to neutralize shunt parasitic effects1 Oct 2026US 2026/0299007 A1
- Diagnostic monitoring and fault detection in vehicle dc power interfaces10 Sep 2026US 2026/0266869 A1Ford Global Technologies, LLC
- Vacuum test fixture for testing printed circuit boards10 Sep 2026US 2026/0266892 A1Rematek Inc.
- Method of manufacturing multilayer pcb for semiconductor testing and multilayer pcb manufactured thereby27 Aug 2026US 2026/0255494 A1Tes Co., Ltd
- System for Testing Electronic Devices on the Move13 Aug 2026US 2026/0235660 A1
Most cited
By later US patents
- Electric probing-test machine having a cooling system170US 5,198,752 ATokyo Electron Limited · 1993
- Capacitively-coupled test probe153US 5,274,336 AHewlett-Packard Company · 1993
- High density electrical interconnect apparatus and method133US 5,800,184 AInternational Business Machines Corporation · 1998
- Apparatus, method and system of liquid-based, wide range, fast response temperature control of electronic device125US 6,389,225 B1Delta Design, Inc. · 2002
- Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method113US 7,015,711 B2atg test systems GmbH & Co. KG · 2006