G01R 31/2808
Holding, conveying or contacting devices
Official title: {Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards (probe, multiprobe, probe manipulator or probe fixture G01R1/067)}
G01R31/2808 (Holding, conveying or contacting devices) appears on 540 US grants and 494 published applications in this corpus.
Search patents in G01R- Granted patents
- 540
- Published applications
- 494
- Assignees
- 323
- Inventors
- 1,270
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 4 | 0 |
| 1989 | 7 | 0 |
| 1990 | 2 | 0 |
| 1991 | 6 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 7 | 0 |
| 1996 | 6 | 0 |
| 1997 | 3 | 0 |
| 1998 | 12 | 0 |
| 1999 | 12 | 0 |
| 2000 | 16 | 0 |
| 2001 | 15 | 7 |
| 2002 | 18 | 7 |
| 2003 | 17 | 15 |
| 2004 | 13 | 23 |
| 2005 | 12 | 20 |
| 2006 | 23 | 20 |
| 2007 | 17 | 17 |
| 2008 | 15 | 18 |
| 2009 | 15 | 23 |
| 2010 | 8 | 15 |
| 2011 | 16 | 23 |
| 2012 | 13 | 21 |
| 2013 | 11 | 21 |
| 2014 | 21 | 16 |
| 2015 | 12 | 15 |
| 2016 | 22 | 22 |
| 2017 | 18 | 15 |
| 2018 | 14 | 22 |
| 2019 | 21 | 26 |
| 2020 | 24 | 25 |
| 2021 | 26 | 26 |
| 2022 | 22 | 18 |
| 2023 | 18 | 25 |
| 2024 | 23 | 22 |
| 2025 | 15 | 21 |
| 2026 | 13 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Longitudinally shiftable electrically conductive contact device22 Sep 2026US 12,742,813 B2Feinmetall GmbH
- Low profile electronic testing system with flexible test PCB format25 Aug 2026US 12,716,913 B2Modus Test, LLC
- Diagnostic device18 Aug 2026US 12,710,472 B2The Boeing Company
- Multiple tile motherboard tester7 Jul 2026US 12,674,836 B2Intelligent Memory Limited
- Automatic wire connection apparatus for circuit board testing2 Jun 2026US 12,644,907 B2Samsung SDI.Co., Ltd.
- Vacuum test fixture for testing printed circuit boards10 Sep 2026US 2026/0266892 A1Rematek Inc.
- System for Testing Electronic Devices on the Move13 Aug 2026US 2026/0235660 A1
- Diagnostic device11 Jun 2026US 2026/0160807 A1The Boeing Company
- Apparatus and method for probing device-under-test30 Apr 2026US 2026/0118405 A1Taiwan Semiconductor Manufacturing Company.Ltd
- High-speed digital testing on circuit boards using modified rf testers30 Apr 2026US 2026/0118415 A1Acculogic Corporation
Most cited
By later US patents
- High density electrical interconnect apparatus and method133US 5,800,184 AInternational Business Machines Corporation · 1998
- Apparatus and method for the testing of circuit boards, and test probe for this apparatus and this method113US 7,015,711 B2atg test systems GmbH & Co. KG · 2006
- Bi-level test fixture for testing printed circuit boards99US 6,054,869 AH+W Test Products, Inc. · 2000
- Emulator probe mountable to a target board at different orientation angles65US 5,781,759 AMitsubishi Denki Kabushiki Kaisha · 1998
- Breakout board using blind vias to eliminate stubs64US 6,462,570 B1Sun Microsystems, Inc. · 2002