Programmable compensating probe attachment to neutralize shunt parasitic effects

Abstract

In some implementations, a device may include a first connection interface structured to receive an uncompensated measurement signal from a shunt on a device under test (DUT). In addition, the device may include one or more adjustable compensation elements in a compensation circuit, the one or more adjustable compensation elements configured to produce a compensated measurement signal by adjusting a frequency response pole of the compensation circuit to compensate for an inductance of the shunt. The device may include a second connection interface structured to output the compensated measurement signal to the test and measurement probe. A test and measurement system includes a test and measurement instrument, a shunt, a compensating circuit, and a test and measurement probe.

Dependencies are inferred from the claim text.