G01R 31/2656
Using non-ionising electromagnetic radiation
Official title: {using non-ionising electromagnetic radiation, e.g. optical radiation}
G01R31/2656 (Using non-ionising electromagnetic radiation) appears on 370 US grants and 264 published applications in this corpus.
Search patents in G01R- Granted patents
- 370
- Published applications
- 264
- Assignees
- 217
- Inventors
- 748
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 6 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 3 | 0 |
| 1982 | 3 | 0 |
| 1983 | 2 | 0 |
| 1984 | 6 | 0 |
| 1985 | 3 | 0 |
| 1986 | 5 | 0 |
| 1987 | 8 | 0 |
| 1988 | 6 | 0 |
| 1989 | 18 | 0 |
| 1990 | 9 | 0 |
| 1991 | 6 | 0 |
| 1992 | 7 | 0 |
| 1993 | 4 | 0 |
| 1994 | 0 | 0 |
| 1995 | 11 | 0 |
| 1996 | 6 | 0 |
| 1997 | 4 | 0 |
| 1998 | 5 | 0 |
| 1999 | 2 | 0 |
| 2000 | 7 | 0 |
| 2001 | 4 | 1 |
| 2002 | 8 | 7 |
| 2003 | 6 | 6 |
| 2004 | 5 | 5 |
| 2005 | 8 | 8 |
| 2006 | 7 | 8 |
| 2007 | 4 | 7 |
| 2008 | 10 | 5 |
| 2009 | 1 | 2 |
| 2010 | 12 | 10 |
| 2011 | 3 | 4 |
| 2012 | 6 | 6 |
| 2013 | 4 | 10 |
| 2014 | 6 | 13 |
| 2015 | 13 | 19 |
| 2016 | 5 | 14 |
| 2017 | 12 | 12 |
| 2018 | 16 | 14 |
| 2019 | 19 | 14 |
| 2020 | 11 | 18 |
| 2021 | 13 | 20 |
| 2022 | 15 | 19 |
| 2023 | 17 | 10 |
| 2024 | 17 | 14 |
| 2025 | 12 | 10 |
| 2026 | 10 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Laser perturbation probing1 Sep 2026US 12,724,062 B2Advanced Micro Devices, Inc.
- Laser-induced hot carrier injection (HCI) for accelerated aging of integrated circuits11 Aug 2026US 12,704,545 B2Intel Corporation
- Dynamic low and high-frequency device characterization28 Jul 2026US 12,693,327 B1Anritsu Corporation
- Substrate inspection apparatus and method of inspecting a substrate using the same14 Jul 2026US 12,681,072 B2Samsung Electronics Co., Ltd.
- Method of analyzing semiconductor structure7 Jul 2026US 12,674,835 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Substrate inspection apparatus and method of inspecting a substrate using the same1 Oct 2026US 2026/0299005 A1Samsung Electronics Co., Ltd.
- Semiconductor device20 Aug 2026US 2026/0243815 A1Fuji Electric Co., Ltd.
- Semiconductor sample evaluation method, semiconductor sample evaluation device and semiconductor wafer manufacturing method6 Aug 2026US 2026/0231734 A1Sumco Corporation
- Optical coupling of photonic devices2 Jul 2026US 2026/0186050 A1O-Net Communications (USA) Inc.
- Substrate testing apparatus21 May 2026US 2026/0140162 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis203US 5,493,236 AMitsubishi Denki Kabushiki Kaisha · 1996
- Apparatus for making surface photovoltage measurements of a semiconductor139US 4,891,584 ASemitest, Inc. · 1990
- Method and apparatus for evaluating surface and subsurface features in a semiconductor127US 4,854,710 ATherma-Wave, Inc. · 1989
- Probe apparatus with a swinging holder for an object of examination118US 5,404,111 ATokyo Electron Limited · 1995
- Semiconductor device evaluation system using optical fiber109US 6,028,435 ANEC Corporation · 2000