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US 12,693,327 B1Granted
Dynamic low and high-frequency device characterization
AssigneeAnritsu Corporation
InventorsJon Martens, Thomas H. Roberts
Life of this patent
Estimating the term…
Abstract
Examples provide internally reconfigurable bias tees for a vector network analyzer. The bias tees can have component sizes that can be electronically switched during device testing. To reduce test time when multiple tests are conducted, examples can further provide for automatic tuning of one or more components of a bias tee, where the one or more components are tuned for the test being performed.
Claims20
A test system comprising:
- a vector network analyzer having a first number of test ports;
- a second number of bias tees, each of the second number of bias tees coupled to a different one of the first number of test ports, wherein at least one of the second number of bias tees comprises a variable component, and wherein the second number is less than or equal to the first number;
- and
- a DC parameter analyzer having a first port to provide a first bias output, wherein the first number of test ports of the vector network analyzer includes a first test port to provide an input radio-frequency (RF) signal, wherein the second number of bias tees includes a first bias tee to receive the input RF signal and the first bias output, and wherein the first bias tee comprises a first variable component.
1 more element
A vector network analyzer comprising:
- a first number of test ports;
- a second number of bias tees, each of the second number of bias tees coupled to a different one of the first number of test ports, wherein at least one of the second number of bias tees comprises a variable component, and wherein at least one of the second number of bias tees are housed in the vector network analyzer, and wherein the second number is less than or equal to the first number;
- a first radio frequency (RF) source to provide a first RF signal;
- a first bias tee in the second number of bias tees to receive the first RF signal, wherein the first bias tee comprises a first variable component, wherein the first bias tee provides a second RF signal, and wherein the first bias tee is housed in the vector network analyzer;
- a first test port in the first number of test ports to provide the second RF signal to a device-under-test, the device-under-test external to the vector network analyzer;
- a second test port in the first number of test ports to receive a third RF signal from the device;
- and
- a second bias tee in the second number of bias tees to receive the third RF signal, wherein the second bias tee comprises a second variable component, and wherein the second bias tee is housed in the vector network analyzer.
5 more elements
Dependencies are inferred from the claim text.