G01R 1/07335
For double-sided contacting or for testing boards with surface-mounted devices
Official title: {for double-sided contacting or for testing boards with surface-mounted devices (SMD's)}
G01R1/07335 (For double-sided contacting or for testing boards with surface-mounted devices) appears on 33 US grants and 18 published applications in this corpus.
Search patents in G01R- Granted patents
- 33
- Published applications
- 18
- Assignees
- 28
- Inventors
- 70
- Latest grant
- 12 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 2 | 3 |
| 2007 | 1 | 0 |
| 2008 | 0 | 2 |
| 2009 | 2 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 2 |
| 2020 | 1 | 1 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 1 | 2 |
| 2024 | 0 | 1 |
| 2025 | 2 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test apparatus for test cards12 Aug 2025US 12,385,948 B2Feinmetall GmbH
- Probe holder and probe unit1 Jul 2025US 12,345,738 B2NHK Spring Co., Ltd.
- Methods and assemblies for tuning electronic modules4 Jul 2023US 11,693,029 B2NXP USA, Inc.
- Contact terminal, inspection jig, and inspection apparatus12 May 2020US 10,649,004 B2Nidec-Read Corporation
- Device for checking electronic cards15 Nov 2016US 9,494,638 B2Larisys Industries
- Apparatus for testing an electronic device11 Jun 2026US 2026/0160784 A1JCET STATS ChipPAC Korea Limited
- Probe holder and probe unit18 Jan 2024US 2024/0019460 A1NHK Spring Co., Ltd.
- Methods and assemblies for tuning electronic modules19 Jan 2023US 2023/0014716 A1NXP USA, Inc.
- Test apparatus for test cards12 Jan 2023US 2023/0008782 A1Feinmetall GmbH
- Test fixture and testing machine having the same3 Dec 2020US 2020/0379011 A1Triple Win Technology(Shenzhen) Co. Ltd.
Most cited
By later US patents
- Circuit board interfacing apparatus121US 4,812,754 A1989
- Completely wireless dual-access test fixture117US 5,500,606 ACompaq Computer Corporation · 1996
- Compact, wireless apparatus for electrically testing printed circuit boards64US 5,157,325 ACompaq Computer Corporation · 1992
- Test apparatus for printed circuit boards40US 4,820,975 AInternational Computers Limited · 1989
- Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts33US 5,436,567 AAutomated Test Engineering, Inc. · 1995