Probe holder and probe unit
AssigneeNHK Spring Co., Ltd.
InventorsOsamu Ito, Kazuya Soma, Hajime Arai
Life of this patent
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AssigneeNHK Spring Co., Ltd.
InventorsOsamu Ito, Kazuya Soma, Hajime Arai
Estimating the term…
A probe holder includes: a first layered member including members layered over one another; and a second layered member bonded to the first layered member and including members layered over one another. Each of the first and second layered members includes: a first member made of a material having a low dielectric constant; a second member provided on one of surfaces of the first member and having higher hardness than the first member; and a third member provided on the other surface of the first member and having higher hardness than the first member. The probe holder further includes a holder hole formed by bonding the third members of the first and second layered members, the holder hole penetrating the probe holder in a direction in which the first and second layered members are layered, and having a stepped hole shape having a smaller diameter in the second members.
A probe holder for holding a contact probe that comes into contact respectively, at both ends of a longitudinal length of the contact probe, with target electrodes, the probe holder comprising:
A probe unit, comprising:
Dependencies are inferred from the claim text.