US 5,500,606 AGranted

Completely wireless dual-access test fixture

AssigneeCompaq Computer Corporation

InventorFrederick J. Holmes

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Abstract

A test fixture including top and bottom probe plates including double-ended pogo pins interfacing top and bottom interface printed circuit board (IPCBs), further including double-ended transfer pins to achieve a true wireless dual access test fixture. The top transfer pins electrically engage the bottom transfer pins after vacuum is applied to allow electrical interface with the top-side fixture without the use of wires. The top fixture mounts in a frame assembly through a parallel linkage keeping the top fixture parallel with the PCB under test. Guide pins mounted on the bottom probe plate are used to align a top plate holding the PCB and also to pre-align with bushings on the top fixture before vacuum is applied. When vacuum is applied, the top plate and top fixture move in a single longitudinal direction to electrically engage the test pins and test pads, preventing lateral movement which heretofore caused significant damage to the test pins and test pads.

Claims2

Dependent claims

A wireless dual-access fixture for electrically interfacing test pads located on a first and a second side of a PCB under test to I/O pins of a tester, the fixture comprising:

a first interface PCB for electrically interfacing the I/O pins of the tester with the test pads of the PCB under test, comprising:
a first set of test pads for electrically interfacing the test pads located on the first side of the PCB under test,
a first set of transfer pads for electrically interfacing the test pads located on the second side of the PCB, under test
a plurality of I/O pads for electrically engaging the I/O pins of the tester, and
electrical traces for electrically connecting said first set of test pads and said first set of transfer pads to said plurality of I/O pads;
a first probe plate, comprising:
a first set of test pins, each having a first end for electrically engaging a corresponding one of said first set of test pads of said first interface PCB and a second end for electrically engaging a corresponding test pad located on the first side of the PCB under test, and
a first set of transfer pins, each having a first end for electrically engaging a corresponding one of said first set of transfer pads of said first interface PCB and a second end;
a second probe plate, comprising:
a second set of test pins, each having a first end for electrically engaging a corresponding test pad located on the second side of the PCB under test and a second end,
a second set of transfer pins, each having a first end for electrically engaging said second end of a corresponding one of said first set of transfer pins and a second end;
and
a second interface PCB for electrically interfacing the I/O pins of the tester with the test pads located on the second side of the PCB under test, comprising:
a second set of test pads, each for electrically engaging said second end of a corresponding one of said second set of test pins,
a second set of transfer pads, each for electrically engaging said second end of a corresponding one of said second set of transfer pins, and
electrical traces for electrically connecting said second set of test pads to said second set of transfer pads.

13 more elements

A wireless dual-access fixture for electrically interfacing I/O pins of a tester with PCB test pads located on a first side and a second side of a PCB, the fixture comprising:

a first interface PCB positioned parallel to the PCB having a first side facing the first side of the PCB, comprising:
a first set of test pads located on said first side of said interface PCB, each one of said first set of test pads being longitudinally aligned with a corresponding one of the PCB test pads located on the first side of the PCB,
a first set of transfer pads for electrically interfacing the PCB test pads located on the second side of the PCB,
a plurality of I/O pads located on said second side of said interface PCB for electrically engaging the I/O pins of the tester, and
electrical conductors routed on said first interface PCB for electrically connecting each one of said first set of test pads and said first set of transfer pads to a corresponding one of said plurality of I/O pads;
a first probe plate interposed between the first side of the PCB and said first side of said first interface PCB, comprising:
a first set of test pins orthogonally aligned between said first set of test pads and the PCB test pads on the first side of the PCB, each one of said first set of test pins having a first end for electrically engaging a corresponding one of said first set of test pads of said first interface PCB and a second end for electrically engaging a corresponding PCB test pad located on the first side of the PCB, and
a first set of transfer pins orthogonally aligned with said first set of transfer pads, each one of said first set of transfer pins having a first end for electrically engaging a corresponding one of said first set of transfer pads of said first interface PCB and a second end;
a second interface PCB positioned parallel to the PCB having a first side facing the second side of the PCB, comprising:
a second set of test pads located on said first side of said second interface PCB, each one of said second set of test pads being longitudinally aligned with a corresponding one of the PCB test pads on the second side of the PCB,
a second set of transfer pads located on said first side of said second interface PCB, and
electrical conductors routed on said second interface PCB for electrically connecting each one of said second set of test pads to a corresponding one of said second set of transfer pads;
and
a second probe plate interposed between the second side of the PCB and said first side of said second interface PCB, comprising:
a second set of test pins orthogonally aligned between said second set of test pads and the PCB test pads on the second side of the PCB, each one of said second set of test pins having a first end for electrically engaging a corresponding one of the PCB test pads on the second side of the PCB and a second end for electrically engaging a corresponding one of said second set of test pads, and
a second set of transfer pins orthogonally aligned with said first set of transfer pads and said first set of transfer pins, each one of said second set of transfer pins having a first end for electrically engaging said second end of a corresponding one of said first set of transfer pins, and a second end for electrically engaging a corresponding one of said second set of transfer pads.

13 more elements

Dependencies are inferred from the claim text.