Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

A two-sided test probe mechanism, comprising:

• a topside, door-mounted array of spring-loaded electrical probes for electrical connection with a first side of a device-under-test (DUT);
• a bottom-side bed-of-nails test probe array for electrically contacting a plurality of testpoints on a second side of said DUT opposite to said first side;
• compressing means mechanically articulated to the topside, doors mounted array of spring-loaded contacts and fixed to the bottom-side bed-of-nails test probe array for clamping said DUT within;
• a lever mechanically connected to the compressing means and articulated to the array of spring-loaded electrical probes and having means for receiving a pushrod force of a first direction perpendicular to a plane including the array of spring-loaded electrical probes and for translating said pushrod force to drive said array of spring-loaded electrical probes independently articulated within the compressing means in a second direction opposite to said first direction and into perpendicular electrical contact with a plurality of testpoints on said first side of said DUT;
• and
• vacuum-actuated means included within the compression means and connected to the bottom-side bed-of-nails test probe array for locking down said DUT during a test and for generating said pushrod force for driving the bottom-side bed-of-nails test probe array into electrical contact with said plurality of testpoints on said second side of said DUT.