G01B 2210/00
Aspects not specifically covered by any group under g01b
Official title: Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
G01B2210/00 (Aspects not specifically covered by any group under g01b) appears on 2,231 US grants and 2,347 published applications in this corpus.
Search patents in G01B- Granted patents
- 2,231
- Published applications
- 2,347
- Assignees
- 920
- Inventors
- 4,470
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 0 | 0 |
| 1978 | 9 | 0 |
| 1979 | 11 | 0 |
| 1980 | 6 | 0 |
| 1981 | 11 | 0 |
| 1982 | 11 | 0 |
| 1983 | 6 | 0 |
| 1984 | 12 | 0 |
| 1985 | 8 | 0 |
| 1986 | 8 | 0 |
| 1987 | 6 | 0 |
| 1988 | 12 | 0 |
| 1989 | 15 | 0 |
| 1990 | 11 | 0 |
| 1991 | 16 | 0 |
| 1992 | 10 | 0 |
| 1993 | 11 | 0 |
| 1994 | 15 | 0 |
| 1995 | 7 | 0 |
| 1996 | 21 | 0 |
| 1997 | 10 | 0 |
| 1998 | 18 | 0 |
| 1999 | 16 | 0 |
| 2000 | 13 | 0 |
| 2001 | 19 | 5 |
| 2002 | 18 | 19 |
| 2003 | 26 | 22 |
| 2004 | 23 | 22 |
| 2005 | 18 | 21 |
| 2006 | 18 | 29 |
| 2007 | 13 | 19 |
| 2008 | 32 | 42 |
| 2009 | 22 | 47 |
| 2010 | 33 | 49 |
| 2011 | 40 | 76 |
| 2012 | 47 | 70 |
| 2013 | 58 | 89 |
| 2014 | 80 | 93 |
| 2015 | 90 | 152 |
| 2016 | 91 | 112 |
| 2017 | 125 | 126 |
| 2018 | 118 | 170 |
| 2019 | 201 | 183 |
| 2020 | 183 | 180 |
| 2021 | 139 | 190 |
| 2022 | 150 | 155 |
| 2023 | 109 | 137 |
| 2024 | 128 | 144 |
| 2025 | 122 | 104 |
| 2026 | 61 | 91 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01B 2210/56Measuring geometric parameters of semiconductor structuresIndexing code703
- G01B 2210/10Wheel alignmentIndexing code565
- G01B 2210/58Wireless transmission of information between a sensor or probe and a controlIndexing code331
- G01B 2210/50Aspects not specifically covered by any group under g01b: using chromatic effectsIndexing code223
- G01B 2210/40Caliper-like sensorsIndexing code180
- G01B 2210/52Combining or merging partially overlapping images to an overall imageIndexing code153
- G01B 2210/54Revolving an optical measuring instrument around a bodyIndexing code54
- G01B 2210/60Unique sensor identificationIndexing code40
All 11 subgroupsShow fewer
Recent patents
- Image-plane self-calibration in interferometry using closed triad imaging6 Oct 2026US 12,754,009 B2Associated Universties, Inc.
- Measurement device and a measurement interface having a radio communications module6 Oct 2026US 12,756,422 B2Renishaw PLC
- Multi-target design for in-situ analysis of semiconductor fabrication process29 Sep 2026US 12,751,240 B2APPLIED Materials.Inc.
- Height measurement sensor using derivative of periodic points22 Sep 2026US 12,742,636 B2ASML Netherlands B. V.
- Film thickness measuring device and film thickness measuring method22 Sep 2026US 12,742,637 B2Hamamatsu Photonics K.K.
- Measuring small angles of wheels of a steered axle using cameras with motion magnification8 Oct 2026US 2026/0309486 A1TORC Robotics, Inc.
- Full wafer thickness map reflectometry24 Sep 2026US 2026/0287327 A1GlobalWafers Co., Ltd.
- Second-harmonic generation for critical dimensional metrology24 Sep 2026US 2026/0287331 A1FemtoMetrix, Inc.
- Method of determining misalignment of semiconductor device24 Sep 2026US 2026/0287345 A1SK hynix Inc.
- Edge shape measurement apparatus and method of measuring edge shape10 Sep 2026US 2026/0266596 A1Fujikoshi Machinery Corp.
Most cited
By later US patents
- Catheter sensor and memory unit511US 4,858,615 ASentron v.o.f. · 1989
- Distance measuring confocal microscope291US 5,785,651 AKeraVision, Inc. · 1998
- System and method for optically measuring a structure261US 5,880,838 ACalifornia Institute of California · 1999
- Method of and apparatus for determining the position of a device relative to a reference234US 4,585,349 ABattelle Memorial Institute · 1986
- Device alignment in inductive power transfer systems203US 9,409,490 B2QUALCOMM Incorporated · 2016