Method of and apparatus for determining the position of a device relative to a reference
AssigneeBattelle Memorial Institute
InventorsDaniel Gross, Claus Dahne
Life of this patent
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AssigneeBattelle Memorial Institute
InventorsDaniel Gross, Claus Dahne
Estimating the term…
A method of and an apparatus for determining the location or position of a surface element with respect to a reference which utilizes polychromatic light and with a holographic lens on the light focuses individual wavelengths thereof to respective focal points at one of which the surface element can be located. Light reflected from this surface element is then decomposed into the respective wavelengths and the intensities of these wavelengths are analyzed to determine the wavelength of greatest intensity, this being the wavelength whose focus corresponds to the focus of the surface element. The maximum intensity wavelength is used to determine the position of this focus and hence the position of the surface element with respect to a reference.
A method of measuring the position of a surface element having at least a limited reflectivity capability, comprising the steps of:
An apparatus for measuring the position of a surface element having at least a limited reflectivity capability, comprising means for generating a polychromatic light beam consisting of a plurality of rays of different wavelengths and substantially the same intensity;
Dependencies are inferred from the claim text.