G01B 2210/40
Caliper-like sensors
G01B2210/40 (Caliper-like sensors) appears on 180 US grants and 197 published applications in this corpus.
Search patents in G01B- Granted patents
- 180
- Published applications
- 197
- Assignees
- 155
- Inventors
- 505
- Latest grant
- 17 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 1 | 0 |
| 1990 | 3 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 2 | 2 |
| 2005 | 2 | 4 |
| 2006 | 2 | 1 |
| 2007 | 2 | 3 |
| 2008 | 2 | 1 |
| 2009 | 0 | 8 |
| 2010 | 5 | 2 |
| 2011 | 3 | 3 |
| 2012 | 2 | 5 |
| 2013 | 4 | 5 |
| 2014 | 6 | 6 |
| 2015 | 10 | 12 |
| 2016 | 4 | 8 |
| 2017 | 6 | 7 |
| 2018 | 11 | 11 |
| 2019 | 11 | 11 |
| 2020 | 13 | 18 |
| 2021 | 16 | 29 |
| 2022 | 17 | 4 |
| 2023 | 10 | 17 |
| 2024 | 10 | 16 |
| 2025 | 12 | 9 |
| 2026 | 6 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01B 2210/44With detectors on both sides of the object to be measuredIndexing code102
- G01B 2210/42With one or more detectors on a single side of the objectIndexing code46
- G01B 2210/48For measurement of a waferIndexing code38
- G01B 2210/46With one or more detectors on a single side of the objectIndexing code18
Recent patents
- Dressing board and shape determining method17 Mar 2026US 12,576,480 B2Disco Corporation
- Method for determining the thickness of a material strip during the feed of the material strip to the machining zone of a machine tool10 Mar 2026US 12,569,904 B2Bruderer AG
- Optical test device10 Mar 2026US 12,571,628 B2JENOPTIK Industrial Metrology Germany GmbH
- Wafer thickness measurement device and method for same3 Feb 2026US 12,540,813 B2Kobelco Research Institute, Inc.
- Angular averaging calibration on bare wafer metrology tools for ESFQR matching improvement20 Jan 2026US 12,529,552 B2KLA Corporation
- Radiation source unit and measurement apparatus20 Aug 2026US 2026/0243562 A1Yokogawa Electric Corporation
- Measuring Jig for Battery Module9 Jul 2026US 2026/0194337 A1LG Energy Solution, Ltd.
- Vane ring inspection tool and process18 Jun 2026US 2026/0168392 A1Pratt & Whitney Canada Corp.
- Measurement tool and system28 May 2026US 2026/0146837 A1GM Global Technology Operations LLC
- Inline terahertz measurement device for dry electrode film manufacturing, and methods thereof7 May 2026US 2026/0126381 A1Tesla, Inc.
Most cited
By later US patents
- Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like93US 5,485,082 AMicro-Epsilon Messtechnik GmbH & Co.KG · 1996
- Web thickness measurement system89US 6,281,679 B1Honeywell-Measurex Corporation · 2001
- Method and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing same74US 4,750,141 AADE Corporation · 1988
- In-situ measurement of a thin film deposited on a wafer68US 5,258,824 AAPPLIED Materials.Inc. · 1993
- Sensor position independent material property determination using radiant energy43US 4,276,480 AAccuray Incorporated · 1981