G01B 2210/44
With detectors on both sides of the object to be measured
Official title: with detectors on both sides of the object to be measured
G01B2210/44 (With detectors on both sides of the object to be measured) appears on 102 US grants and 104 published applications in this corpus.
Search patents in G01B- Granted patents
- 102
- Published applications
- 104
- Assignees
- 95
- Inventors
- 283
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 1 |
| 2005 | 1 | 3 |
| 2006 | 1 | 0 |
| 2007 | 1 | 2 |
| 2008 | 2 | 0 |
| 2009 | 0 | 8 |
| 2010 | 2 | 1 |
| 2011 | 3 | 2 |
| 2012 | 2 | 5 |
| 2013 | 4 | 5 |
| 2014 | 5 | 4 |
| 2015 | 9 | 6 |
| 2016 | 3 | 4 |
| 2017 | 2 | 4 |
| 2018 | 6 | 6 |
| 2019 | 6 | 3 |
| 2020 | 7 | 5 |
| 2021 | 5 | 17 |
| 2022 | 6 | 1 |
| 2023 | 6 | 11 |
| 2024 | 6 | 8 |
| 2025 | 7 | 4 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Optical test device10 Mar 2026US 12,571,628 B2JENOPTIK Industrial Metrology Germany GmbH
- Wafer thickness measurement device and method for same3 Feb 2026US 12,540,813 B2Kobelco Research Institute, Inc.
- Optical axis adjustment jig and optical axis adjustment method2 Dec 2025US 12,487,077 B2Prime Planet Energy & Solutions, Inc.
- Surface flatness detecting device for single crystal square rod2 Dec 2025US 12,487,084 B2Tcl Zhonghuan Renewable Energy Technology Co., Ltd.
- Measurement method18 Nov 2025US 12,474,153 B2Prime Planet Energy & Solutions, Inc.
- Measurement tool and system28 May 2026US 2026/0146837 A1GM Global Technology Operations LLC
- Retraction mechanism and dimension-measuring device provided with same16 Apr 2026US 2026/0104063 A1Tokyo Seimitsu Co., Ltd.
- Apparatus and method for inspecting pouch sealing thickness2 Apr 2026US 2026/0094886 A1Samsung SDI.Co., Ltd.
- Lithium-ion Battery Microwave Single Side Caliper and Conductivity Measurements9 Oct 2025US 2025/0314486 A1Honeywell International Inc.
- Film thickness measurement device, film thickness measurement system, and film thickness measurement method2 Oct 2025US 2025/0305815 A1Honda Motor Co., Ltd.
Most cited
By later US patents
- Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like93US 5,485,082 AMicro-Epsilon Messtechnik GmbH & Co.KG · 1996
- Web thickness measurement system89US 6,281,679 B1Honeywell-Measurex Corporation · 2001
- Method and apparatus for separating fixture-induced error from measured object characteristics and for compensating the measured object characteristic with the error, and a bow/warp station implementing same74US 4,750,141 AADE Corporation · 1988
- In-situ measurement of a thin film deposited on a wafer68US 5,258,824 AAPPLIED Materials.Inc. · 1993
- Sensor position independent material property determination using radiant energy43US 4,276,480 AAccuray Incorporated · 1981