G01B 2210/42
With one or more detectors on a single side of the object
Official title: with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side
G01B2210/42 (With one or more detectors on a single side of the object) appears on 46 US grants and 43 published applications in this corpus.
Search patents in G01B- Granted patents
- 46
- Published applications
- 43
- Assignees
- 48
- Inventors
- 143
- Latest grant
- 17 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 2 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 1 | 0 |
| 2005 | 1 | 2 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 1 |
| 2016 | 0 | 2 |
| 2017 | 3 | 1 |
| 2018 | 1 | 0 |
| 2019 | 1 | 4 |
| 2020 | 1 | 7 |
| 2021 | 6 | 5 |
| 2022 | 5 | 1 |
| 2023 | 1 | 4 |
| 2024 | 2 | 4 |
| 2025 | 5 | 1 |
| 2026 | 2 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Dressing board and shape determining method17 Mar 2026US 12,576,480 B2Disco Corporation
- Thickness measuring device and thickness measuring method to measure thickness of substrate20 Jan 2026US 12,529,556 B2Tokyo Electron Limited
- Step-height measurement device and method for slot die18 Nov 2025US 12,472,529 B2LG Energy Solution, Ltd.
- Measurement method and measurement apparatus for measuring thickness of semiconductor wafer11 Nov 2025US 12,467,741 B2santec Holdings Corporation
- Measurement method, imprint apparatus, and article manufacturing method30 Sep 2025US 12,429,764 B2Canon Kabushiki Kaisha
- Measuring Jig for Battery Module9 Jul 2026US 2026/0194337 A1LG Energy Solution, Ltd.
- Measurement tool and system28 May 2026US 2026/0146837 A1GM Global Technology Operations LLC
- Inline terahertz measurement device for dry electrode film manufacturing, and methods thereof7 May 2026US 2026/0126381 A1Tesla, Inc.
- Step-Height Measurement Device And Method For Slot Die26 Mar 2026US 2026/0084176 A1LG Energy Solution, Ltd.
- Substrate holder surface treatments providing corrosion resistance and wear resistance5 Feb 2026US 2026/0035777 A1APPLIED Materials.Inc.
Most cited
By later US patents
- Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like93US 5,485,082 AMicro-Epsilon Messtechnik GmbH & Co.KG · 1996
- Sensor position independent material property determination using radiant energy43US 4,276,480 AAccuray Incorporated · 1981
- Apparatus to measure select properties of a moving sheet24US 4,277,177 AMeasurex Corporation · 1981
- System and process for measuring and correcting the values of a parameter of a sheet material23US 4,678,915 AMeasurex Corporation · 1987
- Sensor, system and method for determining Z-directional properties of a sheet22US 5,297,062 AMeasurex Corporation · 1994