Inline terahertz measurement device for dry electrode film manufacturing, and methods thereof
AssigneeTesla, Inc.
InventorsArdavan Zandiatashbar, Bonne Eggleston, Kaiping Wang, Christoph Erben, Shikai Jin, Kentaro Tanaka, Minh Pham
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Abstract
A system and method for processing a dry electrode film comprising a roller system, a terahertz measurement device and a dry electrode powder mixture dispenser, are disclosed. The measurement device may comprise a terahertz source and a terahertz sensor. Such terahertz source may be emitted towards an upper and lower surface of the dry electrode film and reflected back towards the terahertz sensor to measure a physical property of the dry electrode film.
Claims21
A system for processing a dry electrode film, comprising:
- a roller system comprising a calender roller;
- a measurement device positioned over the calender roller and comprising a terahertz source and a terahertz sensor, wherein the terahertz source is configured to emit a terahertz radiation pulse and the terahertz sensor is configured to detect a terahertz reflection of the terahertz radiation pulse;
- and
- a dry electrode powder mixture dispenser, wherein the dry electrode powder mixture dispenser is configured to dispense dry electrode material onto the calender roller, wherein the terahertz source is inline with the terahertz sensor.
A method of processing a dry electrode film, comprising:
- disposing a dry electrode film over a calender roller, wherein the dry electrode film comprises a first major surface and a second major surface opposite the first major surface;
- rotating the calender roller thereby forming a moving dry electrode film;
- emitting a terahertz radiation pulse to the moving dry electrode film at a first time point to form a first terahertz reflection from the first major surface and a second terahertz reflection from the second major surface;
- and
- detecting the first terahertz reflection at a second time point by a terahertz sensor and detecting the second terahertz reflection at a third time point by a terahertz sensor.
Dependencies are inferred from the claim text.