G01B 2210/46
With one or more detectors on a single side of the object
Official title: with one or more detectors on a single side of the object to be measured and with a transmitter on the other side
G01B2210/46 (With one or more detectors on a single side of the object) appears on 18 US grants and 22 published applications in this corpus.
Search patents in G01B- Granted patents
- 18
- Published applications
- 22
- Assignees
- 26
- Inventors
- 51
- Latest grant
- 6 Feb 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 2 | 1 |
| 2011 | 0 | 2 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 2 |
| 2016 | 1 | 2 |
| 2017 | 0 | 1 |
| 2018 | 3 | 2 |
| 2019 | 0 | 1 |
| 2020 | 1 | 1 |
| 2021 | 2 | 2 |
| 2022 | 3 | 1 |
| 2023 | 0 | 1 |
| 2024 | 1 | 1 |
| 2025 | 0 | 3 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Thickness measurement using a pulsed eddy current system6 Feb 2024US 11,892,285 B2ABB Schweiz AG
- High accuracy and high stability magnetic displacement sensor in the presence of electromagnetic interferences6 Dec 2022US 11,519,710 B2Honeywell Inc.
- Device for the contactless three-dimensional inspection of blades for a turbomachine, especially an aircraft turbine or jet engine14 Jun 2022US 11,359,913 B2
- Thickness determination of web product by mid-infrared wavelength scanning interferometry22 Feb 2022US 11,255,659 B2Honeywell ASCa Inc.
- Image forming apparatus2 Nov 2021US 11,162,779 B2Canon Kabushiki Kaisha
- Radiation source unit and measurement apparatus20 Aug 2026US 2026/0243562 A1Yokogawa Electric Corporation
- Thickness-distribution measurement device and thickness-distribution measurement metho31 Jul 2025US 2025/0244123 A1Hamamatsu Photonics K.K.
- Comparative measuring tool and measuring method of using the same15 May 2025US 2025/0155241 A1Guilin Gemred Sensor Technology Ltd.
- Measuring parallelism13 Feb 2025US 2025/0052559 A1Samsung Electronics Co., Ltd.
- Method and Device for Measuring a Measurement Object15 Aug 2024US 2024/0271928 A1Micro-Epsilon Messtechnik GmbH & Co.KG
Most cited
By later US patents
- Sensor position independent material property determination using radiant energy43US 4,276,480 AAccuray Incorporated · 1981
- Procedure and means for measuring the thickness of a film-like or sheet-like web28US 4,773,760 A1988
- Non-contacting electromagnetic thickness gauge for sheet measurement having improved small distance sensitivity24US 4,107,606 AMeasurex Corporation · 1978
- System and process for measuring and correcting the values of a parameter of a sheet material23US 4,678,915 AMeasurex Corporation · 1987
- Method and device for measuring the thickness and the electrical conductivity of electrically conducting sheets2US 7,701,205 B2ABB AB · 2010