Method and Device for Measuring a Measurement Object
AssigneeMicro-Epsilon Messtechnik GmbH & Co. KG
InventorsGerhard KIRSCHNER, Daniel SCHWEIZER, Herbert FUELLMEIER
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicro-Epsilon Messtechnik GmbH & Co. KG
InventorsGerhard KIRSCHNER, Daniel SCHWEIZER, Herbert FUELLMEIER
Estimating the term…
A method for measuring a measurement object (1), in particular for determining the position and/or distance of a measurement object (1), for example for measuring the width and/or for measuring the flatness of a measurement object (1), using a measuring system (2) movable along a linear axis (7), wherein the measuring system (2) has at least one sensor (4) and wherein means (9) are arranged to detect a position of a reference point (8) of the measuring system (2), wherein at least one measured value of the measurement object (1) is detected using the sensor (4) and wherein a measurement error of the measured value caused by an inclination of the linear axis (7) by an angle of inclination β is determined and wherein the measured value is corrected by the measurement error.
A method for measuring a measurement object, in particular for determining the position and/or distance of a measurement object, for example for measuring the width and/or for measuring the flatness of a measurement object, comprising:
A device for measuring a measurement object, in particular for determining the position and/or distance of a measurement object, for example for measuring the width and/or for measuring the flatness of a measurement object, comprising:
Dependencies are inferred from the claim text.