Thickness measurement using a pulsed eddy current system
AssigneeABB Schweiz AG
InventorsSten Linder, Jarl Sobel, Anders Eidenvall, Martin Haldin, Aleksander Dzieciol
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AssigneeABB Schweiz AG
InventorsSten Linder, Jarl Sobel, Anders Eidenvall, Martin Haldin, Aleksander Dzieciol
Estimating the term…
A method of non-contact measurement of a thickness (d) of an object of an electrically conductive material by means of a Pulsed Eddy Current, PEC, system including a transmitter coil and a receiver coil. The method includes, after having turned off a current in the transmitter coil, at the receiver coil, measuring a voltage induced by the decaying magnetic field at a first time point, a second time point, and a third time point. The method also includes calculating a total magnetic flux which is generated by the eddy currents in the object at the first time point and picked up by the receiver coil, by comparing the measured flux at the first time point with a predetermined total flux picked up by the receiver coil when no object is present. The method also includes normalizing measured magnetic flux resulting from the eddy currents and picked up by the receiver coil, using the calculated total magnetic flux as a normalization factor such that the normalized eddy current flux is independent of a distance between the object and the transmitter and receiver coils. The method also including, based on the measurements at the first, second and third time points, determining the thickness and the resistivity of the object.
A method of non-contact measurement of a thickness (d) of an object of an electrically conductive material by means of a Pulsed Eddy Current, PEC, system comprising a transmitter coil and a receiver coil, the method comprising:
A computer program product comprising a non-transitory computer readable storage medium storing computer-executable components, wherein the computer executable components when run on processing circuitry of a controller of a Pulsed Eddy Current, PEC, system causes the controller to perform a method of non-contact measurement of a thickness (d) of an object of an electrically conductive material, the method including:
A PEC system for non-contact measurement of a thickness (d) of an object of an electrically conductive material, the PEC system including a transmitter coil, a receiver coil, and a controller comprising:
Dependencies are inferred from the claim text.