G01B 2210/50
Aspects not specifically covered by any group under g01b: using chromatic effects
Official title: Using chromatic effects to achieve wavelength-dependent depth resolution
G01B2210/50 (Aspects not specifically covered by any group under g01b: using chromatic effects) appears on 223 US grants and 269 published applications in this corpus.
Search patents in G01B- Granted patents
- 223
- Published applications
- 269
- Assignees
- 143
- Inventors
- 463
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 1 |
| 2002 | 0 | 2 |
| 2003 | 2 | 1 |
| 2004 | 1 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 4 |
| 2007 | 1 | 3 |
| 2008 | 4 | 9 |
| 2009 | 7 | 5 |
| 2010 | 3 | 8 |
| 2011 | 6 | 8 |
| 2012 | 7 | 7 |
| 2013 | 9 | 11 |
| 2014 | 10 | 8 |
| 2015 | 5 | 9 |
| 2016 | 12 | 11 |
| 2017 | 9 | 14 |
| 2018 | 12 | 20 |
| 2019 | 22 | 21 |
| 2020 | 21 | 14 |
| 2021 | 11 | 18 |
| 2022 | 19 | 19 |
| 2023 | 11 | 23 |
| 2024 | 13 | 21 |
| 2025 | 15 | 9 |
| 2026 | 13 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Chromatic confocal measurement device comprising a camera11 Aug 2026US 12,704,371 B2Sciences Et Techniques Industrielles De La Lumiere
- Full wafer thickness map reflectometry23 Jun 2026US 12,663,259 B2GlobalWafers Co., Ltd.
- Lighting assembly and method for providing measuring light and optical measuring device23 Jun 2026US 12,663,367 B2LMI Technologies Inc.
- Method and apparatus for measuring inner surface and transition curved surface contour of micropore16 Jun 2026US 12,656,106 B1Huazhong University of Science and Technology
- Edge shape measurement apparatus and method of measuring edge shape9 Jun 2026US 12,650,298 B2Fujikoshi Machinery Corp.
- Full wafer thickness map reflectometry24 Sep 2026US 2026/0287327 A1GlobalWafers Co., Ltd.
- Focus Variation Apparatus and Method3 Sep 2026US 2026/0259044 A1University of Huddersfield
- Device for guiding measuring light to be spectrally analyzed, method for manufacturing such a device, and apparatus for measuring distance and thickness27 Aug 2026US 2026/0251440 A1
- Metrology system with chromatic range sensor and collision protection23 Jul 2026US 2026/0210697 A1Mitutoyo Corporation
- Optical sensor apparatus23 Jul 2026US 2026/0210701 A1LMI Technologies Inc.
Most cited
By later US patents
- Distance measuring confocal microscope291US 5,785,651 AKeraVision, Inc. · 1998
- Method of and apparatus for determining the position of a device relative to a reference234US 4,585,349 ABattelle Memorial Institute · 1986
- Chromatic confocal system179US 9,261,358 B2Align Technology, Inc. · 2016
- Method and arrangement for a rapid and robust chromatic confocal 3D measurement technique177US 7,787,132 B2Sirona Dental Systems GmbH · 2010
- Chromatic sensor lens configuration131US 7,626,705 B2Mitutoyo Corporation · 2009