Metrology system with chromatic range sensor and collision protection
AssigneeMitutoyo Corporation
InventorMaxwell James PERKINS
Life of this patent
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AssigneeMitutoyo Corporation
InventorMaxwell James PERKINS
Estimating the term…
A metrology system is provided including a chromatic range sensor optical pen, a measuring machine and an optical pen motion configuration. The optical pen focuses different wavelengths at different distances proximate to a workpiece to be measured. The measuring machine adjusts a relative position between the optical pen and the workpiece (e.g., for utilizing the optical pen for measuring the workpiece). The optical pen motion configuration includes a top portion that is attached to the optical pen and which is configured to move in a positive axial direction (e.g., relative to a holding portion that is attached to the measuring machine), thus enabling the optical pen to move from a rest position (e.g., thus minimizing any potential damage) when a corresponding force in the positive axial direction is applied by a contact (e.g., as corresponding to a collision) of the optical pen with the workpiece or other object.
A metrology system, comprising:
A method for operating a metrology system,
An optical pen motion configuration for use in a metrology system,
Dependencies are inferred from the claim text.