H05H 1/0012
Using electromagnetic or particle radiation
Official title: {using electromagnetic or particle radiation, e.g. interferometry}
H05H1/0012 (Using electromagnetic or particle radiation) appears on 136 US grants and 133 published applications in this corpus.
Search patents in H05H- Granted patents
- 136
- Published applications
- 133
- Assignees
- 112
- Inventors
- 413
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 3 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 4 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 0 | 1 |
| 2002 | 5 | 4 |
| 2003 | 4 | 6 |
| 2004 | 5 | 4 |
| 2005 | 4 | 3 |
| 2006 | 5 | 1 |
| 2007 | 1 | 0 |
| 2008 | 1 | 5 |
| 2009 | 0 | 6 |
| 2010 | 5 | 7 |
| 2011 | 4 | 1 |
| 2012 | 3 | 1 |
| 2013 | 2 | 1 |
| 2014 | 5 | 4 |
| 2015 | 1 | 6 |
| 2016 | 3 | 7 |
| 2017 | 3 | 7 |
| 2018 | 4 | 7 |
| 2019 | 9 | 7 |
| 2020 | 7 | 14 |
| 2021 | 8 | 10 |
| 2022 | 6 | 8 |
| 2023 | 4 | 5 |
| 2024 | 9 | 8 |
| 2025 | 9 | 7 |
| 2026 | 3 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Plasma control for spark optical emission spectroscopy5 May 2026US 12,621,920 B2FEI Company
- Plasma torch device component monitoring21 Apr 2026US 12,610,448 B2Edwards Limited
- Laser-sustained plasma generation in supersonic gas jets27 Jan 2026US 12,538,408 B2KLA Corporation
- Multiple plasma ion source for inline secondary ion mass spectrometry21 Oct 2025US 12,452,988 B2APPLIED Materials.Inc.
- Feedback detection for a treatment device12 Aug 2025US 12,383,143 B2Avava, Inc.
- Apparatus for Controlling a Composition of a Plasma20 Aug 2026US 2026/0247517 A1The University of Liverpool
- Radical Sensing for Process Tool Diagnostics30 Jul 2026US 2026/0221402 A1MKS Instruments, Inc.
- Multiple Plasma Ion Source for Inline Secondary Ion Mass Spectrometry22 Jan 2026US 2026/0025902 A1APPLIED Materials.Inc.
- Feedback detection for a treatment device20 Nov 2025US 2025/0352065 A1Avava, Inc.
- Plasma source chamber for a spectrometer19 Jun 2025US 2025/0198934 A1Thermo Fisher Scientific (Bremen) GmbH
Most cited
By later US patents
- Fiber optic linked flame sensor206US 5,828,797 AMeggitt Avionics, Inc. · 1998
- Harmonic derived arc detector92US 7,728,602 B2MKS Instruments, Inc. · 2010
- Method and apparatus for characterizing a combustion flame71US 6,071,114 AMeggitt Avionics, Inc. · 2000
- Harmonic derived arc detector57US 8,890,537 B2MKS Instruments, Inc. · 2014
- Plasma density information measuring method, probe used for measuring plasma density information, and plasma density information measuring apparatus50US 6,339,297 B12002