Plasma torch device component monitoring
AssigneeEdwards Limited
InventorsGary Peter Knight, Erik Wagenaars, Neil Condon, Simone Magni
Life of this patent
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AssigneeEdwards Limited
InventorsGary Peter Knight, Erik Wagenaars, Neil Condon, Simone Magni
Estimating the term…
Aspects and embodiments relate to plasma torch device component monitoring, a plasma torch device component monitoring system and a plasma torch device including such a monitoring system or suitable for use with such a system. The monitoring method comprises: collecting electromagnetic radiation generated by a plasma torch in a plasma torch device; analysing the collected electromagnetic radiation generated by the plasma torch; comparing the analysed electromagnetic radiation generated to known electromagnetic radiation associated with one or more components of the plasma torch device; and triggering one or more actions in the event that the analysed emission differs from the known emission. Such a monitoring method can allow for ameliorative action to be taken in the event that degradation of one or more components forming the device is detected.
A method comprising:
Dependencies are inferred from the claim text.